2013
DOI: 10.1145/2534394
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Optimal common-centroid-based unit capacitor placements for yield enhancement of switched-capacitor circuits

Abstract: Yield is defined as the probability that the circuit under consideration meets with the design specification within the tolerance. Placement with higher correlation coefficients has fewer mismatches and lower variation of capacitor ratio, thus achieving higher yield performance. This study presents a new optimization criterion that quickly determines if the placement is optimal. The optimization criterion leads to the development of the concepts of C-entries and partitioned subarrays which can significantly re… Show more

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Cited by 5 publications
(8 citation statements)
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“…, where SCi and SCk are the sum of total self-correlation coefficients of Ci and Ck, and SCik is the sum of the cross-correlation coefficient [11,21]. However, in many applications, multiple capacitors are taking into account to the placement.…”
Section: Random Mismatch -Spatial Correlation Modelmentioning
confidence: 99%
See 4 more Smart Citations
“…, where SCi and SCk are the sum of total self-correlation coefficients of Ci and Ck, and SCik is the sum of the cross-correlation coefficient [11,21]. However, in many applications, multiple capacitors are taking into account to the placement.…”
Section: Random Mismatch -Spatial Correlation Modelmentioning
confidence: 99%
“…However, it had been shown that the placement with larger overall correlation coefficient L is not a sufficient criteria [21,22] and thus the Monte-Carlo simulation [23] is conducted to evaluate the random mismatch for simulating the statistical fluctuation.…”
Section: A Performance Metric On Random Mismatchmentioning
confidence: 99%
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