2011 Proceedings - Annual Reliability and Maintainability Symposium 2011
DOI: 10.1109/rams.2011.5754481
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Optimal design for step-stress accelerated degradation testing based on D-optimality

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Cited by 17 publications
(15 citation statements)
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“…When the multivariate normal distribution function is adopted, the parameters are the mean vector and the covariance matrix. Then the left side of (18) can be substituted by (17). The pth percentile lifetime can be obtained by solving this simple equation.…”
Section: Objective Functionmentioning
confidence: 99%
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“…When the multivariate normal distribution function is adopted, the parameters are the mean vector and the covariance matrix. Then the left side of (18) can be substituted by (17). The pth percentile lifetime can be obtained by solving this simple equation.…”
Section: Objective Functionmentioning
confidence: 99%
“…10 The stochastic process model is used to describe the degradation process, and has many advantages. Methods have been developed for optimal design of ADT based on stochastic process models, such as inverse Gaussian process, 11,12 Wiener process, [13][14][15] drift Brownian motion process, 16,17 and Gamma process. [18][19][20] These methods are studied for cases with a single stress or single degradation measure.…”
Section: Introductionmentioning
confidence: 99%
“…The optimal design method for ADT is different for different optimization objectives. In order to improve the fitting accuracy of the degradation model, Ge et al [8] optimized the step stress accelerated degradation test (SSADT) using the Wiener process by maximizing the determinant of the Fisher information matrix, which is also called D-optimization. Ye et al [9] optimized the constant stress accelerated degradation test (CSADT) using the stochastic parameters' Inverse Gauss (IG) process by minimizing the asymptotic variance of the P-quantile of life distribution under the normal stress (i.e., V-optimization), which improves the prediction accuracy of degradation model.…”
Section: Introductionmentioning
confidence: 99%
“…The model is very suitable to describe a time-dependent degradation process in which error terms cannot be assumed to be independent identically normally distributed. Several methods have been developed for ADT based on stochastic process models, such as inverse Gaussian process [16,22], Wiener process [5,6,17], drift Brownian motion process [4,28], and Gamma process [7,18,27]. These methods are mainly from statistical perspective and lacking in support of physical rules; thus, the prediction accuracy depends on sample size and model selection.…”
Section: Introductionmentioning
confidence: 99%