Optimal Design of Step‐stress Accelerated Degradation Test with Multiple Stresses and Multiple Degradation Measures

Wang, Yashun; Chen, Xun; Tan, Ying

doi:10.1002/qre.2133

Cited by 29 publications

(15 citation statements)

References 32 publications

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“…In the last observation at time t N , the whole system has failed in

((),, t_{i_{J}}, t_{i_{J} + 1})

, so it is natural to terminate the test at

t_{i_{J} + 1}

and denote

t_{i_{J} + 1} = t_{N}

. Additionally, following the routine of degradation test in significant number of literatures, we consider a test with fixed inspection interval as follows: ∆t = t k + 1 − t k , where k = 1, ⋯, t N . The parameter estimation in this paper is based on the observations listed above.…”

Section: The Construction Of Likelihood For Load‐sharing Systems Withmentioning

confidence: 99%

Parameter estimation for load‐sharing system subject to Wiener degradation process using the expectation‐maximization algorithm

Liu

Zhao

2018

Quality & Reliability Eng

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In practice, many systems exhibit load‐sharing behavior, where the surviving components share the total load imposed on the system. Different from general systems, the components of load‐sharing systems are interdependent in nature, in such a way that when one component fails, the system load has to be shared by the remaining components, which increases the failure rate or degradation rate of the remaining components. Because of the load‐sharing mechanism among components, parameter estimation and reliability assessment are usually complicated for load‐sharing systems. Although load‐sharing systems with components subject to sudden failures have been intensely studied in literatures with detailed estimation and analysis approaches, those with components subject to degradation are rarely investigated. In this paper, we propose the parameter estimation method for load‐sharing systems subject to continuous degradation with a constant load. Likelihood function based on the degradation data of components is established as a first step. The maximum likelihood estimators for unknown parameters are deduced and obtained via expectation‐maximization (EM) algorithm considering the nonclosed form of the likelihood function. Numerical examples are used to illustrate the effectiveness of the proposed method.

show abstract

“…In the last observation at time t N , the whole system has failed in

((),, t_{i_{J}}, t_{i_{J} + 1})

, so it is natural to terminate the test at

t_{i_{J} + 1}

and denote

t_{i_{J} + 1} = t_{N}

Section: The Construction Of Likelihood For Load‐sharing Systems Withmentioning

confidence: 99%

Parameter estimation for load‐sharing system subject to Wiener degradation process using the expectation‐maximization algorithm

Liu

Zhao

2018

Quality & Reliability Eng

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“…Shahraki et al 183 provides a comprehensive review on degradation processes including interaction between stress variables and multiple degradation processes. Wang et al 184,185 considered multiple stresses and multiple measures in the design of constant-stress and step-stress ADTs, respectively. To handle a large number of decision variables, a simulation-based design method was proposed to overcome the computational difficulties.…”

Section: Recent Trends In At Designmentioning

confidence: 99%

A literature review on planning and analysis of accelerated testing for reliability assessment

Limon

Yadav

Liao

2017

Quality & Reliability Eng

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Accelerated testing has been widely used for several decades. Started with accelerated life tests with constant‐stress loadings, more interest has been focused prominently on accelerated degradation tests and time‐varying stress loadings. Because accelerated testing is crucial to the assessment of product reliability and the design of warranty policy, it is important to develop an efficacious test plan that encompasses and addresses important issues, such as design of stress profiles, sample allocation, test duration, measurement frequency, and budget constraint. In recent years, extensive research has been conducted on the optimal design of accelerated testing plans, and the consideration of multiple stresses with interactions has become a big challenge in such experimental designs. The purpose of this study is to provide a comprehensive review of important methods for statistical inference and optimal design of accelerated testing plans by compiling the existing body of knowledge in the area of accelerated testing. In this work, different types of test planning strategies are categorized, and their drawbacks and the research trends are provided to assist researchers and practitioners in conducting new research in this area.

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“…To obtain the variation rule of luminance performance with time during the failure process of these high‐reliability optoelectronic products and accurately collect their life information in a short time, it was important to conduct an accelerated degradation test (ADT) to analyze luminance attenuation performance and failure mechanisms. The ADT accelerates the degradation process of products by increasing stress but without changing the failure mechanism; the test scheme needs to determine sample capacity, type, and size of accelerated stress, life characteristics, and failure criteria. Life characteristics are the main basis to judge whether a product is valid or not valid.…”

Section: Introductionmentioning

confidence: 99%

Two life prediction models for optoelectronic displays without conventional life tests

et al. 2020

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To precisely predict the life of optoelectronic displays over a short time, two life prediction models were established based on the three‐parameter Weibull right approximation method (TPWRAM). In Model I, the acceleration life under each stress was obtained using TPWRAM, the data points formed by acceleration life and acceleration stress were, respectively, fitted by three extrapolation functions and the optimal extrapolation function was determined by comparing the fitting determination coefficient and root‐mean‐square error. In Model II, after introducing an acceleration parameter, the luminance attenuation data under conventional stress were calculated directly by combining the ones obtained using TPWRAM under each acceleration stress. The luminance attenuation test data from the vacuum fluorescent display (VFD) were collected through four groups of constant‐stress accelerated degradation tests (ADT), and the two models were applied to the life prediction of VFD. The results indicated that the designed ADT scheme was feasible, Model I revealed the changing law of life with stress and simplified the process of life prediction, and Model II made it possible to obtain the luminance attenuation formula at conventional stress without conducting a conventional life test, overcoming the shortcomings of long time‐consuming traditional life tests. It was verified by comparing the life prediction values that the two models had very high precision, and both of these not only achieve the accurate estimation of optoelectronic product life without resorting to conventional life test, but also improved the method of life prediction and perfect its theoretical system.

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Optimal Design of Step‐stress Accelerated Degradation Test with Multiple Stresses and Multiple Degradation Measures

Cited by 29 publications

References 32 publications

Parameter estimation for load‐sharing system subject to Wiener degradation process using the expectation‐maximization algorithm

Parameter estimation for load‐sharing system subject to Wiener degradation process using the expectation‐maximization algorithm

A literature review on planning and analysis of accelerated testing for reliability assessment

Two life prediction models for optoelectronic displays without conventional life tests

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