2021
DOI: 10.1016/j.cam.2020.113317
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Optimal lot sentencing based on defective counts and prior acceptability

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Cited by 2 publications
(2 citation statements)
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“…Kamesh et al [7] discussed a sampling method with mixed exponential means of samples. Fernández [8] studied a count-based sampling test for the number of defects obeying a binomial distribution to determine the sample size of the optimal sampling scheme. Hussain and Aslam et al [9] proposed a ranked set sampling scheme based on exponential distribution.…”
Section: Literature Reviewmentioning
confidence: 99%
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“…Kamesh et al [7] discussed a sampling method with mixed exponential means of samples. Fernández [8] studied a count-based sampling test for the number of defects obeying a binomial distribution to determine the sample size of the optimal sampling scheme. Hussain and Aslam et al [9] proposed a ranked set sampling scheme based on exponential distribution.…”
Section: Literature Reviewmentioning
confidence: 99%
“…Sharma et al [11] studied the design of a sampling scheme for batch products obeying lognormal distribution. Fernández et al [8] studied the sampling design based on defect counts obeying binomial distribution. Alisson et al [12] studied the sampling scheme for products obeying negative binomial distribution.…”
Section: Literature Reviewmentioning
confidence: 99%