Al doped ZnO (AZO) films were prepared on quartz substrates by the co-evaporation of ZnO and Al 2 O 3 by EB-PVD. Structural, optical and electrical properties of AZO films were investigated, focusing on the effect of the electron beam power applied to the Al 2 O 3 ingot. X-ray diffraction measurement showed that the AZO films were highly c-axis oriented. Transmittance of all the AZO films was over 85% in the visible range. The highest reflectance in the near IR range was obtained at the EB power on Al 2 O 3 of 7.5 kW, 73% at 2500 nm. The lowest resistivity of 2.34 © 10 ¹4 ³cm was obtained for the film deposited with the EB power on Al 2 O 3 of 7.5 kW.