2018
DOI: 10.1088/1361-6528/aabec1
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Optimising the visibility of graphene and graphene oxide on gold with multilayer heterostructures

Abstract: Metals have been increasingly used as substrates in devices based on two-dimensional (2D) materials. However, the high reflectivity of bulk metals results in low optical contrast (<3%) and therefore poor visibility of transparent mono- and few-layer 2D materials on these surfaces. Here we demonstrate that by engineering the complex reflectivity of a purpose-designed multilayer heterostructure composed of thin Au films (2-8 nm) on SiO/Si substrate, the optical contrast of graphene and graphene oxide (GO) can be… Show more

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Cited by 15 publications
(31 citation statements)
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“…c,d) Reproduced with permission. [ 56 ] Copyright 2019, AIP Publishing. e) Reproduced under the terms and conditions of the CC‐BY license.…”
Section: Locating 2d Materialsmentioning
confidence: 99%
See 2 more Smart Citations
“…c,d) Reproduced with permission. [ 56 ] Copyright 2019, AIP Publishing. e) Reproduced under the terms and conditions of the CC‐BY license.…”
Section: Locating 2d Materialsmentioning
confidence: 99%
“…Following the criteria mentioned above, substrates that provide high optical contrast for graphene oxide (GO) [ 56 ] and MoS 2 [ 57 ] were developed by introducing a thin gold (Au) film (<13 nm) between the 2D material and the SiO 2 /Si substrate (Figure 2c ). The introduction of the Au film adjusted the reflectivity phase of the substrate to ensure the optimal phase for these 2D materials.…”
Section: Locating 2d Materialsmentioning
confidence: 99%
See 1 more Smart Citation
“…For example, the optical contrast between the graphene and the substrate must be sufficiently high to resolve few-layer graphene by optical or electron microscopy. The number of graphene layers on the substrate can be estimated by correlation between the contrast and the specific thickness: e.g., the number of graphene flakes has been determined by using 7.5 nm Au, 1 nm Ti, and 93 nm SiO 2 stacked on a silicon wafer, and by analyzing the reflected light collecting the image after a 520-nm band pass filter by its optical contrast (Velický et al, 2018). A disadvantage of this method is that the graphene layer thickness can be estimated only by knowing the thickness of one single layer of the 2D nanomaterial.…”
Section: Number Of Layersmentioning
confidence: 99%
“…Also, flake overlapping needs to be avoided. The differences in thickness of <1 nm have been resolved (Khan et al, 2017;Halbig et al, 2018), and also the number of the graphene layers (from one layer up to 10 layers) was determined (Pu et al, 2009;Tan et al, 2017;Velický et al, 2018). To characterize the thicknesses of the deposited graphene layers, focused ion beam (FIB) cuts can be fabricated and analyzed by electron microscopy.…”
Section: Number Of Layersmentioning
confidence: 99%