2005
DOI: 10.1116/1.1993617
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Optimization of an inductively coupled plasma etching process of GaInP∕GaAs based material for photonic band gap applications

Abstract: In this article, we investigate the dry etching of GaInP / GaAs based material system using an inductively coupled plasma ͑ICP͒ etching system. In a view to develop a suitable ICP process for the etching of aluminum-free material, ridge waveguides have been fabricated and the effects of the ICP parameters have been assessed. The coil power and the platen power have been varied at constant pressure and temperature for a chlorine-based process. The surface quality, sidewall profile, and selectivity have been rep… Show more

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Cited by 34 publications
(16 citation statements)
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“…1͑a͒, resulting in an effective photonic potential well. Thanks to an original fabrication technology, 9 based on the use of a GaInP sacrificial layer and a high density plasma etching process, 10 we show that for this cavity design, the Q factor in GaAs membranes can be greatly improved. Thanks to an original fabrication technology, 9 based on the use of a GaInP sacrificial layer and a high density plasma etching process, 10 we show that for this cavity design, the Q factor in GaAs membranes can be greatly improved.…”
mentioning
confidence: 97%
“…1͑a͒, resulting in an effective photonic potential well. Thanks to an original fabrication technology, 9 based on the use of a GaInP sacrificial layer and a high density plasma etching process, 10 we show that for this cavity design, the Q factor in GaAs membranes can be greatly improved. Thanks to an original fabrication technology, 9 based on the use of a GaInP sacrificial layer and a high density plasma etching process, 10 we show that for this cavity design, the Q factor in GaAs membranes can be greatly improved.…”
mentioning
confidence: 97%
“…An InGaP alloy was used as sacrificial layer. Fabrication steps entailed electron-beam lithography, high-density plasma etching (ICP), HCl based wet etching [7].…”
Section: Sample Design Fabrication and Characterisation Techniquementioning
confidence: 99%
“…13 However in the visible optical wavelength range, Si has strong medium propagation loss that makes it not suitable for optical PhC devices. 14 Even the visible transparent materials with large refraction index contrast, such as GaN, AlN, and GaInP, have been used for optical PhC designs, 15,16 most of them suffer from complicated and technologically challenging fabrication process. 17 Recently, Si 3 N 4 has been introduced as an alternative cost-effective optical PhC material due to its metal-oxide compatibility with Si fabrication technology and lossless optical property, which make it a promising candidate for optical PhC design.…”
Section: Introductionmentioning
confidence: 99%