Optimization of ELNES processing using a four-parameter function: application to SiC fibers

Varlot, K.; Martin, Jean Michel

doi:10.1002/(sici)1096-9918(199901)27:1<29::aid-sia458>3.0.co;2-5

Cited by 2 publications

(3 citation statements)

References 6 publications

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“…Quantification of the oxygen content was performed in Digital Micrograph, where the loss in oxygen edge intensity due to beam damage was compensated for by multiplying with a factor of 1.65 19 . Plural scattering of the oxygen and carbon K‐edge was removed using Digital Micrograph, employing the Fourier ratio protocol.

I ((), E) = I_{m} \exp ({}, - r ([], \ln \frac{E}{E_{normalm}} - \frac{E_{m} - E_{0}}{E_{normalm}} + \frac{{((), E_{m} - E_{0})}^{2}}{E_{m} ((), E - E_{0})}))

The ionization continuum of the carbon K‐edge was removed by fitting the equation to the spectrum 31 between 300 and 330 eV, where E 0 is the onset energy (eV), E m is the energy loss at the maximum intensity (eV), I m is the maximum intensity and r is a fitting parameter. E 0 was set at 279 eV, r was set 15 and E m was set at 320 eV.…”

Section: Methodsmentioning

confidence: 99%

“…The ionization continuum of the carbon K-edge was removed by fitting the equation to the spectrum 31 between 300 and 330 eV, where E 0 is the onset energy (eV), E m is the energy loss at the maximum intensity (eV), I m is the maximum intensity and r is a fitting parameter. E 0 was set at 279 eV, r was set 15 and E m was set at 320 eV.…”

Section: Electron Microscopymentioning

confidence: 99%

“…This ionization continuum was subtracted from the carbon K-edge. To the resulting data, six Gaussians were fitted to access bonding information 21,31 using the nonlinear least-squares fitting protocol in Microsoft Excel. For all parameters we used unconstrained fitting.…”

Section: Electron Microscopymentioning

confidence: 99%

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Nanoscale chemical analysis of beam‐sensitive polymeric materials by cryogenic electron microscopy

Wirix

Lazar

Verhoeven

et al. 2021

Journal of Polymer Science

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Nanoscale chemical analysis of functional polymer systems by electron microscopy, to gain access into degradation processes during the materials life cycle, is still a formidable challenge due to their beam sensitivity. Here a systematic study on the different stages of degradation in a P3HT‐PCBM organic photovoltaic (OPV) model system is presented. To this end pristine samples, samples with (reversibly) physisorbed oxygen and water and samples with (irreversibly) chemisorbed oxygen and water are imaged utilizing the full capabilities of cryogenic STEM‐EELS. It is found that oxygen and water are largely physisorbed in this system leading to significant effects on the band structure, especially for PCBM. Quantification proves that degradation concomitantly decreases the amount of CC bonds and increases the amount of COC bonds in the sample. Finally, it is shown that with a pulsed electron beam utilizing a microwave cavity, beam damage can be significantly reduced which likely extends the possibilities for such studies in future.

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