2021
DOI: 10.3390/coatings11050574
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Optimization of Fabrication Process for SiON/SiOx Films Applicable as Optical Waveguides

Abstract: In this paper, the analysis of silicon oxynitride (SiON) films, deposited utilizing the plasma enhanced chemical vapor deposition (PECVD) process, for optical waveguides on silicon wafers is presented. The impact of N2O flow rate on various SiON film properties was investigated. The thickness and refractive index were measured by micro-spot spectroscopic reflectometry and confirmed by spectroscopic ellipsometry. The chemical composition of SiON films was analyzed using Secondary Ion Mass Spectrometry (SIMS). T… Show more

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Cited by 10 publications
(4 citation statements)
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“…As a light source, a 50 µm wide beam with a Gaussian profile was chosen to represent direct coupling with multi-mode fibre and to neglect the offset for the possibility of lacking excitation for some modes, due to the fibre position. While transmission spectra of waveguide cores with refractive indices of 2.0 (pure Si 3 N 4 ) and 1.8 (SiON) do not exhibit any differentiable dip, for the waveguiding core with a refractive index of 1.55 (still well in the range of possibilities of SION material platform [20,21]) the spectrum exhibits strong dip between 500 and 600 nm of wavelength. Such core was used to analyse the influence of the analyte's index of refraction variation with a significant shift corresponding to the change.…”
Section: Methodsmentioning
confidence: 97%
See 1 more Smart Citation
“…As a light source, a 50 µm wide beam with a Gaussian profile was chosen to represent direct coupling with multi-mode fibre and to neglect the offset for the possibility of lacking excitation for some modes, due to the fibre position. While transmission spectra of waveguide cores with refractive indices of 2.0 (pure Si 3 N 4 ) and 1.8 (SiON) do not exhibit any differentiable dip, for the waveguiding core with a refractive index of 1.55 (still well in the range of possibilities of SION material platform [20,21]) the spectrum exhibits strong dip between 500 and 600 nm of wavelength. Such core was used to analyse the influence of the analyte's index of refraction variation with a significant shift corresponding to the change.…”
Section: Methodsmentioning
confidence: 97%
“…Photonics 2023, 10, 618 4 of 10 index of 1.55 (still well in the range of possibilities of SION material platform [20,21]) the spectrum exhibits strong dip between 500 and 600 nm of wavelength. Such core was used to analyse the influence of the analyte's index of refraction variation with a significant shift corresponding to the change.…”
Section: Methodsmentioning
confidence: 99%
“…For the light trapping efficiency (LTE) and light transmission of solar cells, a simple and cost-effective was proposed in this work. For the survey about SiON, the prepared thick film of SiON was characterized by a good transmittance of approximately 95% in the visible-light spectrum [55]. Additionally, the silicon nitride (SiN) light transmittance curve is approximately close to SiON and good in the solar cell light absorption range, making it suitable for application in solar cell antireflection coatings with SiON and high transmission with respect to SiN in the visible spectrum [56].…”
Section: Arcmentioning
confidence: 99%
“…The manner in which corrosion inhibitors bond to the surface is critical in determining whether they can effectively mitigate corrosion. The latter can be investigated using surface analytical techniques, in particular X-ray photoelectron spectroscopy (XPS) and time-offlight secondary ion mass spectrometry (ToF-SIMS) [22][23][24][25][26][27][28]. The recent development of gas cluster ion beam (GCIB) technology in combination with surface analytical techniques enables a detailed study of very thin surface layers [29][30][31][32][33][34][35], e.g., the very thin surface layers of corrosion inhibitors.…”
Section: Introductionmentioning
confidence: 99%