2008
DOI: 10.1016/j.jcrysgro.2007.11.204
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Optimization of furnace design and growth parameters for Si Cz growth, using numerical simulation

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Cited by 40 publications
(17 citation statements)
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“…Using computer simulation instead, one can reproduce crystal growth process and forecast the physical phenomena quickly and economically, including thermal field, melt turbulence, gas convection, thermal stresses, etc., at varying operation and geometry conditions [2][3][4][5][6][7].…”
Section: Introductionmentioning
confidence: 99%
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“…Using computer simulation instead, one can reproduce crystal growth process and forecast the physical phenomena quickly and economically, including thermal field, melt turbulence, gas convection, thermal stresses, etc., at varying operation and geometry conditions [2][3][4][5][6][7].…”
Section: Introductionmentioning
confidence: 99%
“…More importantly, the oxygen content in the grown crystals was greatly reduced leading to longer minority lifetime. Smirnova and Durnev [6] developed a new structure of monosilicon furnace, the growth rate was increased by 15-30%.…”
Section: Introductionmentioning
confidence: 99%
“…Accordingly, the deformation of the growth interface is much reduced, relative to the case of no magnetic field. The shear flow in this layer leads to a W-shaped growth interface geometry, which is known as a source of dislocation generation [26]. The CMF suppresses the buoyancy convection near the crucible wall, a region of high magnetic field intensity.…”
Section: Cmf Effects On the Turbulent Melt Convectionmentioning
confidence: 99%
“…3, for some combinations of crystal and crucible rotation rates the interface shape switches from convex to a W-shape, and the location of the maximum deflection becomes off centre. Profoundly developed W-shaped interfaces are known to act as a dislocation generating source and hence affect the crystal quality [16]. They can also considerably affect the location and intensity of the maximum stress point at the interface.…”
Section: Location Of Maximum Melt/crystal Interface Deflectionmentioning
confidence: 99%