Optimization of SEU Simulations for SRAM Cells Reliability under Radiation

Castellani-Coulie, K.; Aziza, Hassen; Micolau, G.; Portal, J.M.

doi:10.1007/s10836-012-5281-8

Cited by 2 publications

(1 citation statement)

References 18 publications

(19 reference statements)

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“…This zone corresponds to a linear response of the system in the range ±10 %. When results are out of this zone, the resolution is clearly degraded [13] and the pulse characteristics are also not suitable with the resolution of our system. In order to improve the efficiency of the detection and the tracking ability, a 3x3 matrix is modeled and analyzed (Fig.6).…”

Section: Exploration Of the Limit Of Detectionmentioning

confidence: 93%

Detection limit of a VCO based detection chain dedicated to particles recognition and tracking

et al. 2018

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Abstract-A particle detection chain based on CMOS-SOI VCO circuit is presented. The solution is used for the recognition and the tracking of a given particle at circuit level. TCAD simulation of the detector has been performed on a 3x3 matrix of diodes based detector for particles recognition and tracking. The current response of the detector has been used for a case study in order to determine the ability of the chain to recognize an alpha particle crossing a 3x3 detection cell. The detection limit of the proposed solution is investigated and discussed in this paper.

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Section: Exploration Of the Limit Of Detectionmentioning

confidence: 93%

Detection limit of a VCO based detection chain dedicated to particles recognition and tracking

et al. 2018

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SEU Mitigation for SRAM Based on Dual Redundancy Check Method

Wang¹,

Jiang²,

Zhen³

et al. 2014

IJHIT

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The application of Static Random-Access Memory (SRAM), becomes more and more widely in aviation. However, the large amount of SRAM cells is very vulnerable to radiation included single-event upset (SEU). Based on the detection requirement of SRAM's SEU, the detected circuit of the SEU on SRAM is designed. Then the method of redundancy check is used in the reinforcement of the SEU. The test results shows that the detection circuit can detect the SRAM-type storage chip sensitive bit of the single particle and the proposed method can improved the performance of anti-single particles of SRAM several times as high as 1E6.

show abstract

Optimization of SEU Simulations for SRAM Cells Reliability under Radiation

Cited by 2 publications

References 18 publications

Detection limit of a VCO based detection chain dedicated to particles recognition and tracking

Detection limit of a VCO based detection chain dedicated to particles recognition and tracking

SEU Mitigation for SRAM Based on Dual Redundancy Check Method

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