2006
DOI: 10.1109/bec.2006.311097
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Optimization of the Store-and-Generate Based Built-in Self-Test

Abstract: Classical built-in self-test (BIST) architectures are usually relying on linear feedback shift registers (LFSR) for test set generation and test response compaction. This paper is based on extension of the classical BIST, namely hybrid BIST, where pseudorandom test patterns are complemented with precomputed deterministic test patterns to increase the fault coverage and reduce test time. We will propose a method, based on store-and-generate approach, to find the optimal balance between pseudorandom and stored d… Show more

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Cited by 4 publications
(5 citation statements)
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“…The main explanation lies in a fact that the proposed method handles the deterministic and pseudorandom sequences together and the test sets are optimized using a fast optimization method, based on cumulative fault coverage figures. The current implementation of the method [14] is not optimizing the length of the individual hybrid blocks and therefore also the result is worse than the result from [12].…”
Section: Resultsmentioning
confidence: 87%
See 4 more Smart Citations
“…The main explanation lies in a fact that the proposed method handles the deterministic and pseudorandom sequences together and the test sets are optimized using a fast optimization method, based on cumulative fault coverage figures. The current implementation of the method [14] is not optimizing the length of the individual hybrid blocks and therefore also the result is worse than the result from [12].…”
Section: Resultsmentioning
confidence: 87%
“…The results are presented in Table 1, where we have depicted the test length of the final solution under different memory constraints (different amount of seeds. We have compared the method, proposed in this paper, with methods proposed in [12] and [14]. The method proposed in [12] was originally developed for multi-core systems but it can equally well be used also for individual cores.…”
Section: Resultsmentioning
confidence: 97%
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