Optimizing atomic resolution of force microscopy in ambient conditions

Wastl, Daniel S.; Weymouth, Alfred J.; Giessibl, Franz J.

doi:10.1103/physrevb.87.245415

Cited by 57 publications

(184 citation statements)

References 59 publications

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“…95,96 The stability provided by E c can be understood from the proportionality to k and A square. 97,98 The oscillation amplitude A can be arbitrarily set as a set-point in dAFM.…”

mentioning

confidence: 99%

Single cycle and transient force measurements in dynamic atomic force microscopy

Gadelrab¹,

Santos²,

Font

et al. 2013

Nanoscale

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The monitoring of the deflection of a micro-cantilever, as the end of a sharp probe mounted at its end, i.e. the tip, interacts with a surface, forms the foundation of atomic force microscopy AFM. In a nutshell, developments in the field are driven by the requirement of obtaining ever increasing throughput and sensitivity, and enhancing the versatility of the instrument to simultaneously map the topography and quantify nanoscale processes and properties. In the most common dynamic mode of operation, the motion of the driven cantilever is monitored at a single point on its longitudinal axis. Here, we show that from this single point a waveform is obtained that contains all the details about conservative and dissipative interactions. Then a formalism that accounts for multiple arbitrary flexural modes is developed for an indirectly driven cantilever. The formalism is shown to allow recovery of the details of the interaction even in the presence of complex and relevant hysteretic forces when the cantilever oscillates in the steady state. In a different approach, we develop a formalism that monitors the wave profile of the cantilever, i.e. the waveform at five different points on its longitudinal axis. With this formalism the interaction can be reconstructed during a single oscillation cycle even in the transient state of oscillation. Finally, we discuss the potential and advantages of the proposed methods and future technical challenges. Other standard and state of the art techniques and methods are also discussed and compared with the ones presented here. This work should also provide insight into the current high throughput-high sensitivity developments dealing with multifrequency dynamic AFM where information is recovered from multiple eigenmodes.

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“…95,96 The stability provided by E c can be understood from the proportionality to k and A square. 97,98 The oscillation amplitude A can be arbitrarily set as a set-point in dAFM.…”

mentioning

confidence: 99%

Single cycle and transient force measurements in dynamic atomic force microscopy

Gadelrab¹,

Santos²,

Font

et al. 2013

Nanoscale

View full text Add to dashboard Cite

show abstract

“…3 For example, dynamic AFM (dAFM) modes of operation are typically employed to map the topography of conductors and insulators with nanoscale, 4 molecular, 5 sub-molecular, [6][7][8][9] and sometimes atomic resolution. [10][11][12] These dynamic modes typically provide alternative channels 13 to simultaneously map compositional variations. 14 The scientific community is in fact actively seeking to increase the number 15 and sensitivity 13 of contrast channels 12,16,17 since these can be employed to quantify 18,19 nanoscale properties and enhance resolution and/or contrast.…”

mentioning

confidence: 99%

“…14 The scientific community is in fact actively seeking to increase the number 15 and sensitivity 13 of contrast channels 12,16,17 since these can be employed to quantify 18,19 nanoscale properties and enhance resolution and/or contrast. 12,20,21 Recently, two groups 8,11 have independently reported that the tip of the AFM can be made to oscillate with subnm amplitudes, and in the proximity of the surface, i.e., near or in the mechanical contact region, while enhancing resolution even in the presence of adsorbed water layers in ambient conditions. Here, we introduce bimodal AFM, where the second flexural mode of the cantilever is excited with ultra-small oscillation amplitudes while oscillating under such conditions.…”

mentioning

confidence: 99%

“…8 and 11) since these have been shown to be optimum conditions for high resolution imaging in several studies. 11,22 These imaging conditions, or region, are here termed Small Amplitude Small Set-point 8 (SASS) conditions. Then, a second external drive is added to the second mode to enhance contrast 12,13,23 and possibly resolution and quantification.…”

mentioning

confidence: 99%

“…Note also that when adsorbed water layers are present, the tip should oscillate in perpetual contact with these layers 8,25 and as close as possible to the surface 11 while minimizing sample deformation. These are the SASS conditions and have been recently reported 8,11 to decrease background noise and enhance stability and resolution. The flexural modes of the cantilever are modeled with the standard equations 13…”

mentioning

confidence: 99%

See 2 more Smart Citations

Enhanced sensitivity and contrast with bimodal atomic force microscopy with small and ultra-small amplitudes in ambient conditions

Santos

2013

Applied Physics Letters

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Here, we introduce bimodal atomic force microscopy operated with sub-nm and ultra-small, i.e., sub-angstrom, first and second mode amplitudes in ambient conditions. We show how the tip can be made to oscillate in the proximity of the surface and in perpetual contact with the adsorbed water layers while the second mode amplitude and phase provide enhanced contrast and sensitivity.\ud Nonlinear and nonmonotonic behavior of the experimental observables is discussed theoretically with a view to high resolution, enhanced contrast, and minimally invasive mapping. Fractions of meV of energy dissipation are shown to provide contrast above the noise level.Peer ReviewedPostprint (published version

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Nanoscale Ferroelectric Characterization with Heterodyne Megasonic Piezoresponse Force Microscopy

et al. 2021

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Piezoresponse force microscopy (PFM), as a powerful nanoscale characterization technique, has been extensively utilized to elucidate diverse underlying physics of ferroelectricity. However, intensive studies of conventional PFM have revealed a growing number of concerns and limitations which are largely challenging its validity and applications. In this study, an advanced PFM technique is reported, namely heterodyne megasonic piezoresponse force microscopy (HM-PFM), which uses 10 6 to 10 8 Hz high-frequency excitation and heterodyne method to measure the piezoelectric strain at nanoscale. It is found that HM-PFM can unambiguously provide standard ferroelectric domain and hysteresis loop measurements, and an effective domain characterization with excitation frequency up to ≈110 MHz is demonstrated. Most importantly, owing to the high-frequency and heterodyne scheme, the contributions from both electrostatic force and electrochemical strain can be significantly minimized in HM-PFM. Furthermore, a special measurement of difference-frequency piezoresponse frequency spectrum (DFPFS) is developed on HM-PFM and a distinct DFPFS characteristic is observed on the materials with piezoelectricity. By performing DFPFS measurement, a truly existed but very weak electromechanical coupling in CH 3 NH 3 PbI 3 perovskite is revealed. It is believed that HM-PFM can be an excellent candidate for the ferroelectric or piezoelectric studies where conventional PFM results are highly controversial.

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Optimizing atomic resolution of force microscopy in ambient conditions

Cited by 57 publications

References 59 publications

Single cycle and transient force measurements in dynamic atomic force microscopy

Single cycle and transient force measurements in dynamic atomic force microscopy

Enhanced sensitivity and contrast with bimodal atomic force microscopy with small and ultra-small amplitudes in ambient conditions

Nanoscale Ferroelectric Characterization with Heterodyne Megasonic Piezoresponse Force Microscopy

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