“…Such complex resistance state transition and detection processes for write and read operations, respectively, seriously degrade performance, power consumption, and endurance. Previous works have mitigated the degradation of multi-level cell (MLC) STT-MRAMs [12,17,18,19,20,21,22,23,24,25,26,27], but they are not effective for a large LLC comprised of series TLC STT-MRAMs. In this paper, we propose the architecture and operation of a novel LLC comprised of series TLC STT-MRAMs.…”