2019
DOI: 10.1007/s11227-019-02846-1
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Periodic learning-based region selection for energy-efficient MLC STT-RAM cache

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Cited by 2 publications
(2 citation statements)
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“…Apart from the performance measurement of devices under development, FoM comparisons with other state-of-the-art market products are also considered. In general, the FoM assessment of NVM devices commonly focuses on basic characteristics in terms of operation speed, reliability, power consumption, scalability, and cost (Table 3) [15,[79][80][81][82][83][84][85][86][87][88][89]. Price ($/GB) <100k~10~1~1k~100k~100 10k…”
Section: Fom (Figure Of Merit) Of Memory Devicesmentioning
confidence: 99%
See 1 more Smart Citation
“…Apart from the performance measurement of devices under development, FoM comparisons with other state-of-the-art market products are also considered. In general, the FoM assessment of NVM devices commonly focuses on basic characteristics in terms of operation speed, reliability, power consumption, scalability, and cost (Table 3) [15,[79][80][81][82][83][84][85][86][87][88][89]. Price ($/GB) <100k~10~1~1k~100k~100 10k…”
Section: Fom (Figure Of Merit) Of Memory Devicesmentioning
confidence: 99%
“…For now, high-performance volatile memory devices, such as SRAM and DRAM, are commonly used in processors, which perform short latencies (<100 ns), but are more expensive and occupy larger chip areas as compared to silicon flash memories [81,82]. Although some disadvantages including higher cost and lower density exist, emerging NVM technologies demonstrated an operation time comparable to current SRAM and DRAM [83,84].…”
Section: Operation Speedmentioning
confidence: 99%