1982
DOI: 10.1111/j.1365-2818.1982.tb00320.x
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Optimizing thin film X‐ray spectra for quantitative analysis

Abstract: Energy dispersive X-ray detectors are frequently attached to electron microscopes to enable microanalysis to be performed, but because such detectors accept X-rays generated within an appreciable solid angle, the recorded spectra usually include some spurious contributions from the instrument. This paper describes instrumental modifications firstly to reduce and secondly to permit the subtraction of the residual extraneous contributions. The probable accuracy of this subtraction procedure is examined.Results a… Show more

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Cited by 57 publications
(29 citation statements)
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“…In the present study, such extraneous radiation would have arisen primarily from the subsequent scattering of electrons initially scattered by the samples themselves (Nicholson et al, 1982) since the collimation of the electron beam in the EMMA-4 should not allow significant X-ray generation from areas of the specimen or supports outside the main electron beam ('hole' count < 1 c.P.s. ), and the backscattered electrons are deflected away from the detector by the focussing fields (Statham, 1980).…”
Section: R E S U L T S a N D Discussionmentioning
confidence: 98%
“…In the present study, such extraneous radiation would have arisen primarily from the subsequent scattering of electrons initially scattered by the samples themselves (Nicholson et al, 1982) since the collimation of the electron beam in the EMMA-4 should not allow significant X-ray generation from areas of the specimen or supports outside the main electron beam ('hole' count < 1 c.P.s. ), and the backscattered electrons are deflected away from the detector by the focussing fields (Statham, 1980).…”
Section: R E S U L T S a N D Discussionmentioning
confidence: 98%
“…Fine mounted pins seem to give fewer problems with static charging of the sections but damage the support films easily. This problem is particularly acute where, for X-ray analytical reasons (Nicholson, 1974;Nicholson et al, 1982), single hole mounts with large areas of unsupported film are used.…”
Section: Discussionmentioning
confidence: 99%
“…Clearly, the former should be high to reduce statistical errors, whilst the latter should be as low as possible, especially when no correction is to be made for this. Bremsstrahlung correction methods are not considered further here, but see Gupta & Hall (1979), Roomans & Kuypers (1980), Nicholson et al . (1982), Nicholson & Chapman (1983) and Hall & Gupta (1986) for discussions of correction for instrumental contributions to the bremsstrahlung in relation to CN quantification.…”
Section: Techniques For Minimizing Errorsmentioning
confidence: 99%