Knowledge of the electron sampling depth and related saturation effects is important for quantitative analysis of X-ray absorption spectroscopy data, yet for oxides with the perovskite structure no quantitative values are so far available. Here we study absorption saturation in films of two of the moststudied perovskites, La 0.7 Ca 0.3 MnO 3 (LCMO) and YBa 2 Cu 3 O 7 (YBCO), at the L 2,3 edge of Mn and Cu, respectively. By measuring the electron-yield intensity as a function of photon incidence angle and film thickness, the sampling depth d, photon attenuation length λ and the ratio λ/d have been independently determined between 50 and 300 K. The extracted sampling depth d LCMO ≈ 3 nm for LCMO at high temperatures in its polaronic insulator state (150 -300 K) is not much larger than values reported for pure transition metals (d Co or Ni ≈ 2 -2.5 nm) at room temperature, but is smaller than d YBCO ≈ 3.9 nm for metallic YBCO that is in turn smaller than the value reported for Fe 3 O 4 (d Fe3O4 ≈ 4.5 nm). The measured d LCMO increases to 4.5 nm when LCMO is in the metallic state at low temperatures. These results indicate that a universal rule of thumb for the sampling depth in oxides cannot be assumed, and that it can be measurably influenced by electronic phase transitions that derive from strong correlations.