2009
DOI: 10.1016/j.jssc.2009.06.016
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Order–disorder phase transformations in quaternary pyrochlore oxide system: Investigated by X-ray diffraction, transmission electron microscopy and Raman spectroscopic techniques

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Cited by 18 publications
(9 citation statements)
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“…One of the F 2g modes is caused by the 8a oxygen sublattice vibration, and the other modes are attributed to 48f oxygen sublattice vibrations. 18 As reported before, 16 The full width at half maximum of the Raman active bands of the pyrochlore is significantly decreasing, which indicates coarsening of the structure and growth of the particle size when the powders are annealed at progressively higher temperatures. This corresponds well with the increase in the crystallite size measured by XRD and growth of the particle size observed by TEM.…”
Section: Resultssupporting
confidence: 53%
“…One of the F 2g modes is caused by the 8a oxygen sublattice vibration, and the other modes are attributed to 48f oxygen sublattice vibrations. 18 As reported before, 16 The full width at half maximum of the Raman active bands of the pyrochlore is significantly decreasing, which indicates coarsening of the structure and growth of the particle size when the powders are annealed at progressively higher temperatures. This corresponds well with the increase in the crystallite size measured by XRD and growth of the particle size observed by TEM.…”
Section: Resultssupporting
confidence: 53%
“…4). According to the crystal structure of defect uorite and pyrochlore, 27,32 the lattice constant of the defect uorite layer is almost one half that of the pyrochlore unit cell layer as shown by the difference of the (111) spacing. In Fig.…”
Section: Resultsmentioning
confidence: 99%
“…Recently, we have reported an order-disorder transformation in a quaternary pyrochlore oxide system, Ca 2 Ta 2 O 7 -Y 2 Zr 2 O 7 characterised by powder X-ray diffraction, Raman spectroscopy and TEM studies. 32 In the present study, we have prepared a series of pyrochlore-type solid solutions, (Ca x Gd 1-x ) 2 (Zr 1-x M x ) 2 O 7 (x = 0.1, 0.2, 0.3, 0.4, 0.5 and M = Nb or Ta) and studied their structural as well as electrical properties. In addition to this, lattice thermal expansion studies on this system was performed by high-temperature XRD measurements.…”
Section: Introductionmentioning
confidence: 99%