2021
DOI: 10.1002/advs.202102230
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Organic Hyperbolic Material Assisted Illumination Nanoscopy

Abstract: Resolution capability of the linear structured illumination microscopy (SIM) plays a key role in its applications in physics, medicine, biology, and life science. Many advanced methodologies have been developed to extend the resolution of structured illumination by using subdiffraction‐limited optical excitation patterns. However, obtaining SIM images with a resolution beyond 40 nm at visible frequency remains as an insurmountable obstacle due to the intrinsic limitation of spatial frequency bandwidth of the i… Show more

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Cited by 13 publications
(11 citation statements)
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“…According to the theory of super-resolution fluorescence imaging with structured illumination, the resolution enhancement is 1 + k cutoff / k 0 at the emission (detection) wavelength; therefore, the k cutoff of 12 k 0 at the excitation wavelength results in a resolution enhancement around 13 at the emission wavelength. It is worth noting that such a great improvement of the resolution can only be achieved within the optical near fields where the electric field intensity decreases exponentially with distance from the HMM substrate; as a result, the ULH-HMM demonstrated here is a powerful near-field imaging technique with a depth limitation, as discussed in our previous studies. , …”
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confidence: 69%
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“…According to the theory of super-resolution fluorescence imaging with structured illumination, the resolution enhancement is 1 + k cutoff / k 0 at the emission (detection) wavelength; therefore, the k cutoff of 12 k 0 at the excitation wavelength results in a resolution enhancement around 13 at the emission wavelength. It is worth noting that such a great improvement of the resolution can only be achieved within the optical near fields where the electric field intensity decreases exponentially with distance from the HMM substrate; as a result, the ULH-HMM demonstrated here is a powerful near-field imaging technique with a depth limitation, as discussed in our previous studies. , …”
mentioning
confidence: 69%
“…These HMM multilayers are treated as a uniaxial layer. Note that the effective medium approximation (EMA) is widely used in the theoretical model to obtain an effective permittivity of alternating multilayers from permittivities of the respective bulk metals and dielectrics of a composite HMM; however, it is no longer accurate for the ultrathin metal layered HMM used in this work due to the nonlocal or quantum size effect in the ultrathin metals. ,, The permittivity of the ultrathin layered HMMs was obtained by performing ellipsometry measurement of the entire multilayers, instead of using EMA, which requires the permittivity of each layer. By applying the transfer matrix method with the SE measurement data, a good agreement between the measured reflection R , transmission T , and absorption A = 1– R – T spectra and the calculated spectra is obtained (Figure c).…”
Section: Methodsmentioning
confidence: 99%
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