2000
DOI: 10.1063/1.372442
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Orientation dependence of fatigue behavior in relaxor ferroelectric–PbTiO3 thin films

Abstract: Articles you may be interested inMisfit strain dependence of ferroelectric and piezoelectric properties of clamped (001) epitaxial Pb(Zr0.52,Ti0.48)O3 thin films Appl. Phys. Lett. 99, 252904 (2011); 10.1063/1.3669527 Temperature dependence of the current conduction mechanisms in ferroelectric Pb(Zr 0.53 , Ti 0.47 ) O 3 thin films J. Appl. Phys. 95, 3120 (2004); 10.1063/1.1646441 High resolution study of domain nucleation and growth during polarization switching in Pb(Zr,Ti)O 3 ferroelectric thin film capacitors Show more

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Cited by 63 publications
(29 citation statements)
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“…Hence it is important to understand the intrinsic fatigue behavior of each polarization switching path in BiFeO 3 thin fi lms. In this communication, we report polarization fatigue in BiFeO 3 that depends on switching path, and propose a fatigue model which will broaden our understanding of the fatigue phenomenon in low-symmetry materials.Previously, there were reports on fatigue characteristics of rhombohedral ferroelectrics: ferroelastic domain evolution with polarization fatigue in textured fi lms [ 12 , 13 ] and ceramics [ 14 , 15 ] of PZN-PT, and orientation dependence showing (111)-oriented samples are more easily fatigued than (001)-oriented ones in PZN-PT [16][17][18] and BiFeO 3 . [ 19 ] In order to study the intrinsic behavior of switching-path dependent fatigue, it is crucial (1) to control a single polarization switching path among the three possible ones (71 ° , 109 ° and 180 ° ) during switching cycles [ 20 , 21 ] and (2) to remove the extrinsic effects of the pre-existing domain or grain boundaries affecting polarization switching.…”
mentioning
confidence: 99%
“…Hence it is important to understand the intrinsic fatigue behavior of each polarization switching path in BiFeO 3 thin fi lms. In this communication, we report polarization fatigue in BiFeO 3 that depends on switching path, and propose a fatigue model which will broaden our understanding of the fatigue phenomenon in low-symmetry materials.Previously, there were reports on fatigue characteristics of rhombohedral ferroelectrics: ferroelastic domain evolution with polarization fatigue in textured fi lms [ 12 , 13 ] and ceramics [ 14 , 15 ] of PZN-PT, and orientation dependence showing (111)-oriented samples are more easily fatigued than (001)-oriented ones in PZN-PT [16][17][18] and BiFeO 3 . [ 19 ] In order to study the intrinsic behavior of switching-path dependent fatigue, it is crucial (1) to control a single polarization switching path among the three possible ones (71 ° , 109 ° and 180 ° ) during switching cycles [ 20 , 21 ] and (2) to remove the extrinsic effects of the pre-existing domain or grain boundaries affecting polarization switching.…”
mentioning
confidence: 99%
“…Here, triangular instead of rectangular pulses are applied to the sample, thereby allowing for time-resolved subtraction of the non-switching components. 73 Analysis of the data in panel (b) provides values of P s ≈ 8 μC cm -2 , P r ≈ 7 μC cm -2 , and E c ≈ 245 kV cm -1 . The factor of ~4 difference in P s and P r between the dynamic and remanent P-E data indicates that the KLE-templated PZT films suffer from comparably large parasitic capacitances and leakage currents.…”
Section: Resultsmentioning
confidence: 99%
“…In this work, we carried out a comparative investigation of structural and ferroelectric properties of preferentially oriented PZT thin films on BPO buffer layers with different thicknesses (23,65, and 136 nm). The PZT/BPO heterostructure deposited on platinized silicon wafer is randomoriented.…”
Section: Introductionmentioning
confidence: 99%