ABSTRACT:The orientation distribution functions of the (200) and (002) crystal planes of nylon 6 are affected by the degree of crystallinity. As for one specimen with crystallinity 47%, these functions of the (200) and (002) crystal planes have maxima at polar angles 8j=0° and 8j=90°, respectively. By contrast, as for the other specimen with crystallinity 28%,. both functions have a maximum at polar angle 8j=90°. These two orientation modes were analyzed using a deformation mode of nylon 6 spherulites. As for the results, this cause was due to the difference of the orientation mode of crystal b-axis, that is, (a) the b-axis orientation associated with the rotation of crystallites around its own c*-axis designating the axis perpendicular to the a-and c-axes and (b) the b-axis orientation associated with random rotation of the crystallites around their own b-axis. The type (a) orientation predominates in the case of a crystallinity 47%, while the type (b) orientation does in the case of crystallinity 28%. A light scattering apparatus was made so that the scanning bench (arm) supporting the photomultiplier could be moved horizontally at a desired fixed angle between the bench and the horizontal direction. This apparatus provided detailed information about the morphology and the deformation mechanism of nylon 6 spherulites. The light scattering pattern from nylon 6 spherulites was accounted for by one from the spherulites with a disorder of the optical axis orientation in the angular distribution.KEY WORDS (200) and (002) Crystal Planes I The b-Axis Orientation I Nylon 6 Spherulite I Light Scattering Apparatus I Scanning Bench I Angular Distribution I Several studies 1 -3 on the crystal orientation of semicrystalline polymers under uniaxial stretching have been made in relation to the deformation mechanism of the polymer spherulites. Those studies involved comparisons of observed results with those calculated on a model of spherulitic deformation in terms of the orientation distribution functions of reciprocal lattice vectors of particular crystal plane. This method is suitable for evaluating the orientation mechanism of crystallites when the diffraction intensities from the crystal planes are too weak, except those of one or two crystal planes, to obtain correct and detailed data.