2018
DOI: 10.1063/1.5028407
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Oxidation mechanism of thin Cu films: A gateway towards the formation of single oxide phase

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Cited by 164 publications
(91 citation statements)
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“…The PLD chamber vacuum was 1.7 × 10 −1 Torr during the annealing under the O 2 supply. After the completion of the annealing process, the pure Cu metal layer was converted into the CuO through the oxidation [ 23 ]. The CuO samples are named as CuO-10 s, CuO-20 s, CuO-30 s, CuO-50 s and CuO-0.5A, CuO-1A, CuO-2A, CuO-3A and CuO-5A, respectively, based on the variation of deposition time and current density.…”
Section: Methodsmentioning
confidence: 99%
“…The PLD chamber vacuum was 1.7 × 10 −1 Torr during the annealing under the O 2 supply. After the completion of the annealing process, the pure Cu metal layer was converted into the CuO through the oxidation [ 23 ]. The CuO samples are named as CuO-10 s, CuO-20 s, CuO-30 s, CuO-50 s and CuO-0.5A, CuO-1A, CuO-2A, CuO-3A and CuO-5A, respectively, based on the variation of deposition time and current density.…”
Section: Methodsmentioning
confidence: 99%
“…Apart from this, any defect in the structure like pores, cracks, etc may also play a role. During the oxidation process, CuO oxide forms first as Cu is less stable just above 300°C [26][27][28][29][30]. After that, the remaining elements start oxidizing oxidized.…”
Section: Xrd Analysismentioning
confidence: 99%
“…For both reaction schemes, the reduction step can simultaneously occur on the secondary OH‐groups that are oxidized to ketones, while the formed aldehydes can easily be further oxidized to carboxylic acids . The oxidation of the formed Cu 2 O film to a CuO film is kinetically limited by the oxygen diffusion through the thin (∼1 nm) CuO surface oxide layer . The CuO layer is too thin to be detected by the XRD, but it is generally agreed that this layer is always present under ambient conditions …”
Section: Influence Of the Reducing Agentmentioning
confidence: 99%
“…The oxidation of the formed Cu 2 O film to a CuO film is kinetically limited by the oxygen diffusion through the thin (∼1 nm) CuO surface oxide layer . The CuO layer is too thin to be detected by the XRD, but it is generally agreed that this layer is always present under ambient conditions …”
Section: Influence Of the Reducing Agentmentioning
confidence: 99%
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