DOI: 10.32657/10356/152681
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Oxide-defects driven study on reliability and synaptic response characterization of logic devices

Abstract: for their technical conversations and knowledge sharing. In particular, I would also like to thank Dr. Lin Ye for being very supportive in many aspects during my doctoral study. Senior Sing Yew, appreciate your patience in helping to proofread the thesis. Your feedback is particularly helpful! Greatest gratitude to their assistance, I can carry out experimental research so smoothly and thoroughly.I would like to owe a vote of thanks to the well-experienced technicians in NTU Semiconductor Characterization Lab,… Show more

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