1966
DOI: 10.1038/211958a0
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Oxygen-inhibited Grain Growth in Thin Films of Semiconducting Cuprous Iodide

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Cited by 10 publications
(21 citation statements)
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“…Further, it is well known that the electronic and optical properties of CuI can degrade significantly when stored in ambient condition for long durations. 24,[32][33]36 Therefore, we monitor the optical only improves its optical transparency and holes conductivity but also increases its stability in ambient condition.…”
Section: Resultsmentioning
confidence: 99%
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“…Further, it is well known that the electronic and optical properties of CuI can degrade significantly when stored in ambient condition for long durations. 24,[32][33]36 Therefore, we monitor the optical only improves its optical transparency and holes conductivity but also increases its stability in ambient condition.…”
Section: Resultsmentioning
confidence: 99%
“…Previously, it has been postulated that degradation of CuI samples with time is because of recrystallization, grain growth, loss of iodine and unwanted oxidation of CuI. 32 Therefore, to better understand the reason for improved stability of CuI-TiO2-180 in comparison to pure CuI samples, combined SEM-CL measurements were performed on aged CuI and CuI-TiO2-180 samples. It is quite apparent from the images that the grains in aged pure CuI (Figure 6(a-b)) have grown large and rough over time, most probably due to re-crystallization and discontinuous grain growth, leading to increased light scattering and decreased transparency.…”
Section: Resultsmentioning
confidence: 99%
“…The effect of oxygen on the (long term) grain stability and related optical haze has been discussed in Ref. with the conclusion that oxygen inhibits grain growth in CuI thin films.…”
Section: Cui Materialsmentioning
confidence: 99%
“…Depending on the fabrication route, CuI films frequently have rough surface morphology and thus a frosted‐glass‐like appearance. The most common synthesis route of CuI films is the chemical reaction of Cu thin films with vapor‐phase iodine (known as the vapor iodination method) . The Cul films produced by this method usually have very rough surface morphology with the surface roughness of ≈80 nm .…”
mentioning
confidence: 99%