Oxygen partial pressure dependence of the structural properties of CdO thin films deposited by a modified reactive vacuum evaporation process

UV irradiation influence on the structural and optical properties of CdO thin films

“…The shift towards higher 2θ values of the diffraction maxima relative to their normal positions, as it results from Table 1, confirms the above assumption. Similar shifts of the diffraction maxima have been also noticed by other authors for CdO thin films prepared by spray pyrolysis [22,23] and by reactive vacuum evaporation [17]. The shifts were attributed to the lattice contraction.…”

Effects of fluorine doping on the structural properties of the CdO films deposited by ultrasonic spray pyrolysis

“…This could be the possible cause for the increase of the lattice parameter. In order to investigate the possibility of the preferential orientation of the samples, we have calculated the texture coefficient (TC) (h k l) for all planes using the expression [8,26]:…”

“…where b is the FWHM, l is the wavelength of Cu Ka radiation, D is the crystallite size, and e is the strain [8,26]. (b cos y)/l vs. (sin y)/l plots for the samples are shown in Fig.…”

Sensor Arrays Based on the Differential Isfet Elements for Monitoring of Toxic Substances of Natural and Artificial Origin

“…Òîíêîïë³-âêîâ³ îêñèäè ÑdO ³ ZnO º øèðîêîçîííèìè íàï³âïðîâ³äíèêàìè ãðóïè À 2  6 , ïðîçîðèìè ó âèäèì³é îáëàñò³ ñïåêòðà åëåêòðîìàãí³òíîãî âèïðîì³íþâàííÿ ³, çà ïåâíèõ óìîâ îòðèìàííÿ, ìîaeóòü âîëîä³òè âèñîêîþ åëåêòðîïðîâ³äí³ñòþ.  á³ëüøîñò³ âèïàäê³â òàê³ ïë³âêè òà ñòðóêòóðè ç ¿õí³ìè ñêëàäîâèìè îòðèìóþòü ìåòîäîì ìàãíå-òðîííîãî ðîçïèëåííÿ, âèêîðèñòîâóþ÷è ñêëàä-íå òåõíîëîã³÷íå îáëàäíàííÿ [2][3][4][5]. Ìåòîä ïóëü-âåðèçàö³¿ ç íàñòóïíèì ï³ðîë³çîì, ó ïîð³âíÿíí³ ç ìàãíåòðîííèì ðîçïèëåííÿì, âîëî䳺 ðÿäîì ïåðåâàã, ñåðåä ÿêèõ ïðîñòîòà îáëàäíàííÿ, ìîae-ëèâ³ñòü îäåðaeàííÿ ïë³âîê âåëèêî¿ ïëîù³, â ò³ì ÷èñë³ íà ïðîô³ëüíèõ ï³äêëàäêàõ, äîñòóïí³ñòü òåõíîëî㳿 òà íèçüêà âàðò³ñòü ê³íöåâîãî ïðîäó-êòó [1,6].…”