1999
DOI: 10.1889/1.1834081
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P‐25: Secondary ‐Electron‐Emission Analysis of MgO Films in ac Plasma Displays

Abstract: The ion‐induced secondary‐electron‐emission yield of MgO films by the ion gun method was successfully measured. Variations due to crystal orientation and ion kinetic energy were observed. Ejected electron energy showed correlation with the ionization energy of the gas.

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Cited by 19 publications
(10 citation statements)
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“…The cathode fall voltage is known to be closely related to γ , which was treated theoretically in references [39,44] and evaluated experimentally in this study, using the C12A7 electride. Figure 3 shows the setup used for measuring γ in this study [32][33][34][35][45][46][47][48][49]. It consists of a vacuum chamber, an ion gun and an electrode to collect the emitted electrons.…”
Section: Secondary Electron Emissionmentioning
confidence: 99%
“…The cathode fall voltage is known to be closely related to γ , which was treated theoretically in references [39,44] and evaluated experimentally in this study, using the C12A7 electride. Figure 3 shows the setup used for measuring γ in this study [32][33][34][35][45][46][47][48][49]. It consists of a vacuum chamber, an ion gun and an electrode to collect the emitted electrons.…”
Section: Secondary Electron Emissionmentioning
confidence: 99%
“…In order to reduce discharge voltage and power consumption of PDPs, the yield of secondary electron emission from the MgO coating (0.01 0.5) must be improved significantly [1,2]. A significant research efforts has been directed to increase the coefficient of secondary electron emission by patterning [1], changing preferred orientation [3] and alloying MgO layer [4,5]. These studies had only lead to a limited improvement in the coefficient and in reduction of discharge voltages.…”
Section: Introductionmentioning
confidence: 99%
“…There have been various attempts to increase the coefficient of secondary electron emission of MgO, which include doping of MgO material [1], patterning of the layer [2], and controlling of orientation of MgO layer [3], etc. These approaches, however, have resulted in a marginal improvement of such characteristics.…”
Section: Introductionmentioning
confidence: 99%