2017 IEEE 67th Electronic Components and Technology Conference (ECTC) 2017
DOI: 10.1109/ectc.2017.322
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Packaging Innovations for High Voltage (HV) GaN Technology

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Cited by 8 publications
(3 citation statements)
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“…For high-voltage, the Discretes Flat No-leads (DFN) package is used by several manufacturers for an achievable high-voltage (up to 1200 V) that exhibits few stray inductances. For integrated GaN technology, the Quad Flat No-Lead (QFN) package is preferred, with some improvement as described in [34]. The growth of GaN devices in the semiconductor market goes hand in hand with the development of packages that can exploit the advantage of the switching characteristics of HEMT transistors, featuring a compact size to reduce parasitic inductance and the isolation strength capability to achieve the high-voltage switches that are increasingly demanded.…”
Section: Package Solutionsmentioning
confidence: 99%
“…For high-voltage, the Discretes Flat No-leads (DFN) package is used by several manufacturers for an achievable high-voltage (up to 1200 V) that exhibits few stray inductances. For integrated GaN technology, the Quad Flat No-Lead (QFN) package is preferred, with some improvement as described in [34]. The growth of GaN devices in the semiconductor market goes hand in hand with the development of packages that can exploit the advantage of the switching characteristics of HEMT transistors, featuring a compact size to reduce parasitic inductance and the isolation strength capability to achieve the high-voltage switches that are increasingly demanded.…”
Section: Package Solutionsmentioning
confidence: 99%
“…A single Quad Flat No-Lead (QFN) novel package solution is developed for the integration of a GaN FET and its driver with superior product manufacturability and performance. 162 The literature highlights the design of a PCB inductor with flexible ferrite sheet in view of optimizing the inductor volume. It also considers the thermal issues along with the inductor stray capacitances.…”
Section: Pcb Layout/designmentioning
confidence: 99%
“…ith the widespread commercialization of trench-based power devices such as trench field plate power Metal Oxide Semiconductor Field Effect Transistor (MOSFET), trench super junction MOSFET, trench field-stop Insulated Gate Bipolar Transistor (IGBT) and trench MOS barrier Schottky (TMBS) to minimize on-state power consumption, reliability weaknesses such as High Temperature Reverse Bias (HTRB) and Temperature Humidity Bias (THB) are starting to surface as potential threat to hamper future technology development efforts, especially in the area of device scaling, edge termination design as well as the use of smaller, thinner and greener packages [1][2][3].…”
Section: Introductionmentioning
confidence: 99%