Parallel detecting super-resolution microscopy using correlation based image restoration

Yu, Zhongzhi; Liu, Shaocong; Zhu, Dan; Kuang, Cuifang; Liu, Xü

doi:10.1016/j.optcom.2017.04.065

Cited by 10 publications

(5 citation statements)

References 15 publications

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“…This latter enhancement is known as the super-brightness effect (4). To highlight the importance to have access to the scanned images − which is precluded in all-optical implementations −, we derived a method based on phase-correlation (6,16), which estimates the shift-vectors for the pixel reassignment directly from the scanned images (Fig. 1c, Supplementary Note 2), making the prior knowledge of the pixel-reassignment factor, and more in general the need of theoretical shift-vectors, obsolete.…”

Section: Confocal Microscopy | Time-resolved Spectroscopy | Image Sca...mentioning

confidence: 99%

A robust and versatile platform for image scanning microscopy enabling super-resolution FLIM

et al. 2019

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Section: Confocal Microscopy | Time-resolved Spectroscopy | Image Sca...mentioning

confidence: 99%

A robust and versatile platform for image scanning microscopy enabling super-resolution FLIM

et al. 2019

View full text Add to dashboard Cite

“…In this work, the shift vectors are directly estimated from the scanned images, without the need for any input from the user. In particular, we use a phase-correlation approach 39 , 55 capable of automatically taking into consideration the geometry of the detector array and the magnification of the microscope system, which can compensate for distortions (misalignments and aberrations) of the system that may arise during imaging. Very importantly in the context of this work, this automatic estimation of the shift vectors accounts for the saturation level of the STED experiment, i.e.…”

Section: Methodsmentioning

confidence: 99%

Focus image scanning microscopy for sharp and gentle super-resolved microscopy

et al. 2022

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To date, the feasibility of super-resolution microscopy for imaging live and thick samples is still limited. Stimulated emission depletion (STED) microscopy requires high-intensity illumination to achieve sub-diffraction resolution, potentially introducing photodamage to live specimens. Moreover, the out-of-focus background may degrade the signal stemming from the focal plane. Here, we propose a new method to mitigate these limitations without drawbacks. First, we enhance a STED microscope with a detector array, enabling image scanning microscopy (ISM). Therefore, we implement STED-ISM, a method that exploits the working principle of ISM to reduce the depletion intensity and achieve a target resolution. Later, we develop Focus-ISM, a strategy to improve the optical sectioning and remove the background of any ISM-based imaging technique, with or without a STED beam. The proposed approach requires minimal architectural changes to a conventional microscope but provides substantial advantages for live and thick sample imaging.

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“…In this work the shift-vectors are directly estimated from the scanned-images, without the need for any input from the user. In particular, we use a phase correlation approach [33, 48] capable of automatically taking into consideration the geometry of the detector array and the magnification of the microscope system, which can compensate for distortions (misalignments and aberrations) of the system that may arise during imaging. Very importantly in the context of this work, this automatic estimation of the shift-vectors accounts for the saturation level of the STED experiment, i.e.…”

Section: Methodsmentioning

confidence: 99%

Focus-ISM for Sharp and Gentle Super-Resolved Microscopy

Tortarolo

Zunino

Fersini

et al. 2022

Preprint

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Super-resolution microscopy is routinely used for fixed and thin samples, while its feasibility for imaging live and thick samples is still limited. In the case of stimulated emission depletion (STED) microscopy, the high-intensity illumination required to achieve effective sub-diffraction resolution can introduce photo-damage, thus reducing the compatibility of the technique with live-cell imaging. Moreover, the out-of-focus fluorescence background may overcome the often faint signal stemming from the focal point, thus constraining imaging to thin samples. Here, we combined STED microscopy with image-scanning microscopy (ISM) to mitigate these limitations without any practical disadvantages. We first enhanced a laser scanning microscope (LSM) by introducing a detector array, hence providing access to a set of additional spatial information that is not available with a typical single-element detector. Then, we exploited this extended dataset to implement focus-ISM, a novel method that relaxes the high-intensity requirement of STED microscopy and removes the out-of-focus background. Additionally, we generalized the focus-ISM method to conventional LSM, namely without a STED beam. The proposed approach requires minimal architectural changes compared with conventional STED microscopes but provides substantial advantages for live and thick sample imaging while maintaining all compatibility with all recent advances in STED and confocal microscopy. As such, focus-ISM represents an essential step towards a universal super-resolved LSM technique for subcellular imaging.

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Parallel detecting super-resolution microscopy using correlation based image restoration

Cited by 10 publications

References 15 publications

A robust and versatile platform for image scanning microscopy enabling super-resolution FLIM

A robust and versatile platform for image scanning microscopy enabling super-resolution FLIM

Focus image scanning microscopy for sharp and gentle super-resolved microscopy

Focus-ISM for Sharp and Gentle Super-Resolved Microscopy

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