We have developed a high-throughput x-ray characterization system, which can rapidly screen structure, composition and x-ray scintillation of combinatorial materials libraries using energy-dispersive x-ray diffraction, x-ray fluorescence, and x-ray photoluminescence. This system consists of an x-ray source, a polycapillary x-ray lens, one or two x-ray energy detectors, and a fiber optic spectrometer. A Windows-based software package was also developed to control the measurement system and data acquisition automatically. Examples are also demonstrated to show the applicability of this system.