2007 International Conference on Thermal, Mechanical and Multi-Physics Simulation Experiments in Microelectronics and Micro-Sys 2007
DOI: 10.1109/esime.2007.360042
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Parameter Identification on Wafer Level of Membrane Structures

Abstract: A fast identification method of membrane structure parameters is investigated for an early stage of the manufacturing process. The approach consists of performing optical measurement of the modal responses of the membrane structures. This information is used in an inverse identification algorithm based on a FE model.Device characteristics can be determined by measured modal frequencies which are fed into a model based on the FE simulations. The number of parameters to be identified is thereby generally limited… Show more

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“…Lawrence and Rembe [8] used this method to characterize electric comb drives and Fig. 3 Block diagram of proposed system cantilevers, and Michael et al [9] used it to inspect membrane structures of micro-electro-mechanical systems.…”
Section: Literature Reviewmentioning
confidence: 99%
“…Lawrence and Rembe [8] used this method to characterize electric comb drives and Fig. 3 Block diagram of proposed system cantilevers, and Michael et al [9] used it to inspect membrane structures of micro-electro-mechanical systems.…”
Section: Literature Reviewmentioning
confidence: 99%