6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes 2012
DOI: 10.1117/12.2010725
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Parametric definition for the CGH patterns and error analysis in interferometric measurements

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Cited by 8 publications
(7 citation statements)
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“…Given a 2 m diameter F ∕2 aspheric surface with the fourth-order coefficient A −1.220 × 10 −13 mm −3 , B −1.691 × 10 −20 mm −5 is under test, setting h 500 mm, p 450 mm, and L 0 0.5 mm, the needed t is 11.9 mm according to Eqs. (14), (16), and (17). Actually, t 11.7 mm (approximate error ∼1.7%) is chosen to design the CGH with Zemax.…”
Section: Cgh Design Example For a Concave Weak Aspheric Surface Wimentioning
confidence: 99%
See 2 more Smart Citations
“…Given a 2 m diameter F ∕2 aspheric surface with the fourth-order coefficient A −1.220 × 10 −13 mm −3 , B −1.691 × 10 −20 mm −5 is under test, setting h 500 mm, p 450 mm, and L 0 0.5 mm, the needed t is 11.9 mm according to Eqs. (14), (16), and (17). Actually, t 11.7 mm (approximate error ∼1.7%) is chosen to design the CGH with Zemax.…”
Section: Cgh Design Example For a Concave Weak Aspheric Surface Wimentioning
confidence: 99%
“…Setting the filter plane 455.44 450 5.44 mm away from the CGH plane, while still treating p 450 mm, and assuming the required minimum separated distance L 0 0.5 mm, the needed t is 9.5 mm according to Eq. (14). Actually, t 9.5 mm is chosen.…”
Section: B Cgh Design Examples For Conic Surfacesmentioning
confidence: 99%
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“…Different with compensator, CGH is a diffraction optical element, shown in Fig.1 Aspheric surface under test r J circular, and the wanted diffraction order is (+1,+1) [4] . When the spherical wavefront from interferometer passes through CGH, the +1 diffraction order wavefront changes into aspherical wavefront, which is match with the aspheric surface under test.…”
Section: Cgh Test Technologymentioning
confidence: 99%
“…They argued the SDO (−1, 3) and (3, −1) has the most significant effect on measurement accuracy and calculated the minimum amount of power carrier frequency to separate SDO. In 2012, P. Zhou et al [7] developed the parameter model to describe the CGH null system in power carrier frequency and calculated the distance from the pinhole to its paraxial image. This distance was used to evaluate the separation of SDO.…”
Section: Introductionmentioning
confidence: 99%