2010
DOI: 10.1107/s0021889810005856
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Parametric Rietveld refinement for the evaluation of powder diffraction patterns collected as a function of pressure

Abstract: Under the assumption that the structural parameters of a crystalline phase change `smoothly' with increasing pressure, the evolution of the parameters can be parameterized as a function of pressure using continuous monotonic functions. Four different approaches to determine the structural evolution of As2O5 with increasing pressure from a set of powder diffraction patterns collected over the pressure range from 2.5 to 19.5 GPa have been investigated. Approach (A) was the common sequential refinement of atomic … Show more

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Cited by 12 publications
(14 citation statements)
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“…composition, temperature or pressure) in order to restrain the Rietveld refinement to fit a three-dimensional space of 2, intensity and a parameter dependent on the external variable (Stinton & Evans, 2007). This has been used in a wide variety of studies to understand material structure with regards to electric field, composition, temperature, magnetic field and pressure (Daniels, 2008;Marlton et al, 2017;Daniels et al, 2010;Olsen et al, 2017;Mabied et al, 2012;Halasz et al, 2010;Scarlett et al, 2009). However, care must be taken when applying the parametric technique to avoid enforcing unphysical restraints on the structural model.…”
Section: Introductionmentioning
confidence: 99%
“…composition, temperature or pressure) in order to restrain the Rietveld refinement to fit a three-dimensional space of 2, intensity and a parameter dependent on the external variable (Stinton & Evans, 2007). This has been used in a wide variety of studies to understand material structure with regards to electric field, composition, temperature, magnetic field and pressure (Daniels, 2008;Marlton et al, 2017;Daniels et al, 2010;Olsen et al, 2017;Mabied et al, 2012;Halasz et al, 2010;Scarlett et al, 2009). However, care must be taken when applying the parametric technique to avoid enforcing unphysical restraints on the structural model.…”
Section: Introductionmentioning
confidence: 99%
“…This linearization is fully valid for cubic materials, whereas it is a reasonable approximation for tetragonal or orthorhombic cases. Considering the main restriction for the use of the Murnaghan EoS, namely, that it is only valid up to a compression of approximately 10% [6,27], a parameterization can be carried out without loss of refinement quality, as this compression level is first reached at the critical pressure of the second order phase transition, which is far beyond the hydrostatic limit of the used pressure medium. This means that below the hydrostatic limit the Murnaghan EoS will be fully applicable in the parameterization, whereas above, the lattice parameters have either to be individually refined or to be fixed to the values determined by the sequential Rietveld refinement.…”
Section: Parametric Rietveld Refinementmentioning
confidence: 99%
“…The parameterization of the lattice parameters up to the hydrostatic limit can be done by using a linearized inverted Murnaghan EoS [6,9,27]:…”
Section: Parametric Rietveld Refinementmentioning
confidence: 99%
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