Parametric X-rays and transition-diffracted radiation in crystal stacks

A technique is proposed for determining beam dimensions on a target by measuring two-dimensional angular distributions of the radiation for two distances between the crystal where the radiation is generated and a coordinate detector. The dimensions are determined from the results of a least squares method procedure with varying parameters, where the adjustable function is the distribution for a shorter distance and the fitting function is the convolution of the angular distribution at a greater distance with a twodimensional Gaussian distribution whose parameters are uniquely related to the beam dimensions on the target and the distances between the crystal and the detector. The minimum measured beam sizes are about 50-60 μm for the parametric x-ray mechanism and an electron energy of less than 1 GeV and 10-15 μm for the mechanism of diffracted transition radiation and electrons with an energy above several GeV.

show abstract

“…As has been shown in several papers (see, e.g., Refs. [10,27]), the two-dimensional angular distribution of the DTR can be represented as…”

Section: Proposed Measurement Techniquementioning

confidence: 99%

New method of electron beam transverse size measurement by angular distribution of emission in a thin crystal

Goponov

Laktionova

Shatokhin

et al. 2019

Phys. Rev. Accel. Beams

View full text Add to dashboard Cite

show abstract

“…To simplify the simulation process, instead of using the DTR angular distribution obtained in ref. [15], we used the azimuthally symmetric spectral-angular distribution of transition radiation, known as the Garibyan formula [7].…”

Section: Effect Of Emission Of Secondary Electrons and Quantamentioning

confidence: 99%

Method of spatial size measurement of relativistic electrons beams with small bunch length

et al. 2020

View full text Add to dashboard Cite

We investigate the practical implementation of a previously proposed method for determining the transverse dimensions of an electron beam on a target by measuring the two-dimensional angular distributions of diffracted transition radiation of relativistic electrons for two distances between the crystal where the radiation is generated and the coordinate detector for femtosecond bunches. We show that determining electron microbunches with small longitudinal sizes requires an increased photon energy, achieved by decreasing the observation angle. The sensitivity limits of the method and the influence of the emission of secondary electrons and photons from the detector pixels are discussed. K: Beam-line instrumentation (beam position and profile monitors; beam-intensity monitors; bunch length monitors); Detector modelling and simulations I (interaction of radiation with matter, interaction of photons with matter, interaction of hadrons with matter, etc); Instrumentation for FEL 1Corresponding author.

show abstract

“…The electron-beam divergence was μrad. It is known, for example, [19,20] that the angular DTR distribution can be represented in the form: (7) where and is the factor characterizing the DTR yield, which depends on the observation angle and the photon energy. The contribution of this mechanism was not taken into account because of the small DTR intensity.…”

Section: We Assume Thatmentioning

confidence: 99%

Proposal for a Procedure for Measuring the Transverse Dimensions of a Beam of Relativistic Electrons with a Small Longitudinal Size

Vnukov

Goponov

Laktionova

et al. 2020

J. Synch. Investig.

View full text Add to dashboard Cite

The possibility of implementing a previously proposed procedure for determining the beam dimensions at a target is analyzed; it includes the measurement of two-dimensional angular distributions of the coherent radiation of fast electrons for two distances between a crystal, where radiation is generated, and a coordinate detector. The use of two mechanisms of parametric X-ray radiation and diffracted transition radiation is considered. The limits of the method sensitivity and the influence of the departure of secondary electrons and photons on them are discussed.

show abstract

Parametric X-rays and transition-diffracted radiation in crystal stacks

Cited by 17 publications

References 4 publications

New method of electron beam transverse size measurement by angular distribution of emission in a thin crystal

New method of electron beam transverse size measurement by angular distribution of emission in a thin crystal

Method of spatial size measurement of relativistic electrons beams with small bunch length

Proposal for a Procedure for Measuring the Transverse Dimensions of a Beam of Relativistic Electrons with a Small Longitudinal Size

Contact Info

Product

Resources

About