Particle‐induced desorption in mass spectrometry. Part II. Effects and applications

Abstract

In the second part of this review (see preceding article for Part I), desorption‐induced processes by polyatomic projectiles over a broad energy range is described. The nonlinear increase in secondary ion yields as a function of the number of constituent atoms, which is evidence for “collective” effects, is discussed. Effects accompanying ion ejection upon monotornic or polyatomic particle impact, namely secondary electron emission, impact‐induced luminescence (photon emission), and sputtering of clusters (fullerenes in particular) by energetic ions, are intimately related to the mechanisms of desorption, and for that reason are also reviewed. Some of these phenomena, linked to, e.g., methods of ion detection, have (or may have in the future) practical applications in analytical mass spectrometry. In conclusion, selected examples for useful analytical applications of desorption methods like PDMS and FAB mainly in the biochemical field, which may illustrate current and emerging trends and perspectives, are discussed. © 1996 John Wiley & Sons, Inc.

Collisions of ions with surfaces at chemically relevant energies: Instrumentation and phenomena

“…[27][28][29] The keV collision energy regime, with collision energies up to about 10 keV, has a long research history, dating back to the first ion scattering experiments. 2 Impact of keV ͑the SIMS experiment͒ 9,30,31 and MeV energy ͑plasma desorption͒ 32 ions causes ablation of target material and can be used for chemical analysis. These experiments can be performed in a quasi-nondestructive fashion with respect to molecules present at or near the surface.…”

Static secondary ion mass spectrometry (S-SIMS) Part 1: methodology and structural interpretation

“…This means that the secondary ion yield per incident atom is much higher than in the case of an atomic primary ion impact. As a result, polyatomic ions are seen as a promising way to improve the molecular information in S-SIMS by the``softer'' sputtering and ionization of the surface molecules (Demirev, 1995b;Vickerman, 1998). As a result, development and application of polyatomic primary ion guns are foreseen to be the major instrumental development in the near future.…”

Surfactant-Enhanced Desorption/Ionization on Silicon Mass Spectrometry

“…Perfluorinated carboxylic acids have found use as ion-pair reagents for reversed-phase separations of amino acids , and small peptides with ESI-MS detection; they have also found application in micellar electrokinetic chromatography directly coupled to mass spectrometry . Fluorinated surfaces have further been used for surface-induced dissociation in conjunction with plasma desorption mass spectrometry. , A novel method for evaluation of oligomeric protein structures using perfluorooctanoic acid as detergent in conjunction with PAGE was developed by Ramjeesingh et al, perfluorooctanesulfonic acid-PAGE (PFOS-PAGE) . The usefulness of this strategy has subsequently been illustrated in several publications. − …”

“…33 Fluorinated surfaces have further been used for surface-induced dissociation in conjunction with plasma desorption mass spectrometry. 34,35 A novel method for evaluation of oligomeric protein structures using perfluorooctanoic acid as detergent in conjunction with PAGE was developed by Ramjeesingh et al, perfluorooctanesulfonic acid-PAGE (PFOS-PAGE). 36 The usefulness of this strategy has subsequently been illustrated in several publications.…”