2018
DOI: 10.1109/jmems.2018.2874771
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Particle Tracking of Microelectromechanical System Performance and Reliability

Abstract: Microelectromechanical systems (MEMS) that require contact of moving parts to implement complex functions exhibit limits to their performance and reliability. Here, we advance our particle tracking method to measure MEMS motion in operando at nanometer, microradian, and millisecond scales. We test a torsional ratcheting actuator and observe dynamic behavior ranging from nearly perfect repeatability, to transient feedback and stiction, to terminal failure. This new measurement capability will help to understand… Show more

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Cited by 9 publications
(4 citation statements)
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References 17 publications
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“…Copeland et al propose a recognition method to extract the information features of MEMS inertial sensor data, that is, to recognize gestures by extracting the feature quantities and variation laws of acceleration and angular velocity. This method cannot recognize gestures related to time sequence, and there are some limitations in the recognition of complex gestures [ 7 ]. Tu et al improve the feature extraction method and added time series to recognize gestures related to time sequence.…”
Section: Literature Reviewmentioning
confidence: 99%
“…Copeland et al propose a recognition method to extract the information features of MEMS inertial sensor data, that is, to recognize gestures by extracting the feature quantities and variation laws of acceleration and angular velocity. This method cannot recognize gestures related to time sequence, and there are some limitations in the recognition of complex gestures [ 7 ]. Tu et al improve the feature extraction method and added time series to recognize gestures related to time sequence.…”
Section: Literature Reviewmentioning
confidence: 99%
“…We consider two that bracket the range of experimental complexity, and we introduce a second new concept of tracking multiple emitters as indicators of the six degrees of freedom of microscale bodies. Our two new concepts are synergistic, as multiple emitters improve tracking precision by rigid transformations that combine information through the central limit theorem [9][10][11][12] , while the rigidity and planarity of a microscale body enable rigorous tests of tracking accuracy. Toward the simple end of the application range, the deposition of fluorescent particles on an imaging substrate -a microscale body that is ubiquitous in localization microscopy -allows calibration of aberration effects 5,6,13,14 and correction of instrument drift [15][16][17] .…”
Section: Introductionmentioning
confidence: 99%
“…This essential function of machines has diverse applications to optical traps 21 , colloidal motors 22 , tunable photonics 23,24 , reconfigurable metadevices 25 , materials characterization 26,27 , and even safety switches of extreme consequence 28 . The latter application motivated the development of our test system, which is exemplary of microsystem technologies that integrate multiple parts, are nominally planar, and benefit from tracking in two dimensions and three degrees of freedom to elucidate their motion 9,11,12,29,30 . However, measurements in three dimensions 31 and six degrees of freedom are much more informative, as we show in this study.…”
Section: Introductionmentioning
confidence: 99%
“…The presence of contaminants is vital in the production of very sensitive to dirt electronic packages [1]. The products should be of acceptable quality.…”
Section: Introductionmentioning
confidence: 99%