1999
DOI: 10.1016/s0013-4686(99)00094-8
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Passivation and corrosion of microelectrode arrays

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Cited by 93 publications
(42 citation statements)
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“…A wide variety of common problems that affect silicon-based micromachined devices when used in electrolyte solutions was documented and explained by Schmitt et al [27]. Problems were generally attributed to insuf®cient barrier properties and poor corrosion resistance of common passivation layers.…”
Section: Fabrication Shortcomingsmentioning
confidence: 99%
See 1 more Smart Citation
“…A wide variety of common problems that affect silicon-based micromachined devices when used in electrolyte solutions was documented and explained by Schmitt et al [27]. Problems were generally attributed to insuf®cient barrier properties and poor corrosion resistance of common passivation layers.…”
Section: Fabrication Shortcomingsmentioning
confidence: 99%
“…The failure in this case was attributed to penetration of Cl À through the insulating layer and its subsequent reaction with the Al interconnect traces. It was recommended that locating the traces inside the thermal SiO 2 layer and substituting gold for aluminum can prevent such failure of a microfabricated devices [27,28].…”
Section: Fabrication Shortcomingsmentioning
confidence: 99%
“…[1,2] Thus, for example, they are widely used in very large scale integration (VLSI) technology, [3,4] as anticorrosion protective layers, [5] hydrophobic coatings, [6] and passivation layers. [7] A common method of preparation of these thin films is PECVD.…”
Section: Introductionmentioning
confidence: 99%
“…We could attribute this to the lamination of the band electrode. Lamination is one of the defect or failure mode that normally occurs in silicon based microsensors [21,22]. As have been reported, non-uniform current densities on the electrode surface can contribute on electrodes damage [23,24].…”
Section: Figurementioning
confidence: 93%