Passive-intermodulation analysis between rough circular waveguide flanges using Weibull distribution

B., Wang, X.; Zhang, N.; Hu, Taotao; Sun, Qinfen; Cui, Wanzhao; Ye, Mu; He, Yun

doi:10.1109/apemc.2010.5475733

Cited by 2 publications

(3 citation statements)

References 9 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…However, it is noticed that the expression for the constriction resistance R c is different from other authors' work due to using the fractal model in this article. Combining the fractal method, the constriction resistance can be calculated by this formula as follows

\frac{1}{R_{c}} = \sum \frac{4 r_{i} ([], {(\frac{a_{l}}{π r_{i - 1}^{2}})}^{D / 2} - {(\frac{a_{l}}{π r_{i}^{2}})}^{D / 2})}{(ρ_{M 1} + ρ_{M 2})}

where, ρ M 1 and ρ M 2 are the resistivity of the two contact metals, respectively. a l is the area of the largest spots and r i is the radius of the spots.…”

Section: The Equivalent Circuit Modelcontrasting

confidence: 65%

“…And it is named Metal‐Insulator‐Metal structure. Because the equivalent circuit has been researched by other authors, the parameters of the circuit such as C c , C n ‐ c , R (nonlinear) c , and R (nonlinear) n ‐ c can also be found in the References or Appendix .…”

Section: The Equivalent Circuit Modelmentioning

confidence: 99%

“…Ye et al has calculated the PIM level in the rectangular waveguide flanges using Weibull distribution. Then Wang has also calculated the PIM in the circular waveguide flanges using Weibull distribution. In these researches, regardless of Gaussian distribution or Weibull distribution, statistical parameters are used to describe the topographical characterization of contacting surfaces.…”

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

Analysis of passive intermodulation between rough rectangular waveguide flanges using fractal method

Bai

Cui

2019

Int J RF Microw Comput Aided Eng

View full text Add to dashboard Cite

In nature, most of the surfaces are rough and waveguide flanges are not exception. And these surfaces topography are of high importance in the response of the waveguide flanges connection system. These surfaces topography are usually described by statistical parameters. And statistical parameters depend strongly on the resolution of the roughness-measuring instrument, and hence the values of statistical parameters are not unique for a surface. As a result, the predictions of passive intermodulation (PIM) level of microwave devices based on these statistical parameters also may not be unique to a pair of contacting surfaces. Fortunately, fractal method is independent on the resolution of the roughness-measuring instrument. Therefore, the randomness of the rough surface is not affected by the differences in the model. Consequently, if PIM level of rectangular waveguide is predicted with fractal parameters, the predicted value will be unique. Based on this motivation, a new model is developed. In this model, the fractal method is used to characterize the surface topography of waveguide flanges. Then, the third order PIM level of a rectangular waveguide flange is predicted. The analytic results are verified by PIM test set-up. This work is help to understand PIM phenomenon and design the low-PIM waveguide.

show abstract

\frac{1}{R_{c}} = \sum \frac{4 r_{i} ([], {(\frac{a_{l}}{π r_{i - 1}^{2}})}^{D / 2} - {(\frac{a_{l}}{π r_{i}^{2}})}^{D / 2})}{(ρ_{M 1} + ρ_{M 2})}

where, ρ M 1 and ρ M 2 are the resistivity of the two contact metals, respectively. a l is the area of the largest spots and r i is the radius of the spots.…”

Section: The Equivalent Circuit Modelcontrasting

confidence: 65%