2015
DOI: 10.1016/j.matdes.2015.07.002
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Pathway into the silicon nucleation on silicene substrate at nanoscale

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Cited by 12 publications
(4 citation statements)
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“…In the COMPASS force field, a semi-ionic model was used. Some involved parameters and physical properties of the COMPASS force field for the simulation of CuO, TiO 2 28 , and SiO 2 have been fully described in these references and well parametrized in Materials Studio. To the best of our knowledge, there is no such parameter description of ZrO 2 for the COMPASS force field from Materials Studio online help or any open reference.…”
Section: Computational Detailsmentioning
confidence: 99%
“…In the COMPASS force field, a semi-ionic model was used. Some involved parameters and physical properties of the COMPASS force field for the simulation of CuO, TiO 2 28 , and SiO 2 have been fully described in these references and well parametrized in Materials Studio. To the best of our knowledge, there is no such parameter description of ZrO 2 for the COMPASS force field from Materials Studio online help or any open reference.…”
Section: Computational Detailsmentioning
confidence: 99%
“…In order to investigate vacancy-induced damage, the radial distribution function (RDF) of the silicon target was calculated during collision cascades as the first step. RDF is an analytical method commonly used to study changes in an entire structure [21,22], and has the following form:…”
Section: Silicon Target Surface Damage During Energetic Cluster Ion Imentioning
confidence: 99%
“…The liquid melt still has an analogous layer-by-layer growth pattern, similar to nucleation on a single substrate. 50,52 Nevertheless, with an increasing gap between the substrates, the intact level of formed layers is destroyed by the decrease of interactions with the substrate. When the separation reaches 21.535 Å, the melt in the gap is formed into a trilaminar "pyramid structure" and a quintuplicate nanostructure is also found in the 31.207 Å confined space as shown in Fig.…”
Section: (B) and (C)mentioning
confidence: 99%