Pattern image enhancement by extended depth of field

Chef, Samuel; Billiot, Bastien; Jacquir, Sabir; Sanchez, Kevin J.; Perdu, Philippe; Binczak, Stéphane

doi:10.1016/j.microrel.2014.07.056

Cited by 3 publications

(1 citation statement)

References 10 publications

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“…Finally, as long as acquisition duration is involved, several mechanical challenges and constraints may arise such as securing the DUT or minimizing vibrations or the drifting of the optical system (loss of focus). Regarding the latter, measure of focus as described in [23] may tackle this issue. As a conclusion, even if the process for SRAM descrambling is constituted of a few basic steps, a full automation for the mapping of a complete memory array is a more complex task requiring some R&D work in various fields of engineering.…”

Section: B Process Automation For the Mapping Of Complete Arraymentioning

confidence: 99%

Descrambling of Embedded SRAM Using a Laser Probe

Chef

Chua

Tay

et al. 2018

2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

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Understanding the organization of memory is a mandatory first step in various fields of applications such as failure analysis, defect localization, qualification and testing of space electronics, and security evaluation. For the last category, localization of specific addresses may be used for content estimation or encryption key recovery, with several techniques being reported for this task. In this paper, we discuss the application of laser probing for descrambling memory embedded in 8 bits microcontrollers designed and manufactured by different companies in various technology nodes.

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Section: B Process Automation For the Mapping Of Complete Arraymentioning

confidence: 99%