(Pb1xCdx)S Nanoparticles Embedded in a Conjugated Organic Matrix, as Studied by Photoluminescence and Light-Induced X-ray Photoelectron Spectroscopy

Buller, R.; Cohen, Hagai; Minkin, E.; Popovitz‐Biro, Ronit; Lifshitz, Efrat; Lahav, Michal

doi:10.1002/1616-3028(20021016)12:10<713::aid-adfm713>3.0.co;2-6

Cited by 20 publications

(10 citation statements)

References 20 publications

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“…[20][21][22][23][24] Surface potential shifts related to external electron gun stimulation and/or illumination via laser or other light sources are observable in XP spectra of composite semiconductor surfaces. 25 For such surfaces, it has been demonstrated that photovoltaic and photoconductive properties are related to static or quasistatic shifts of XPS peaks.…”

Section: Introductionsupporting

confidence: 44%

Photoresponse of PbS nanoparticles–quaterthiophene films prepared by gaseous deposition as probed by XPS

Majeski

Pleticha

Bolotin

et al. 2012

Journal of Vacuum Science &Amp; Technology A: Vacuum, Surfaces, and Films

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Semiconducting lead sulfide (PbS) nanoparticles were cluster beam deposited into evaporated quaterthiophene (4T) organic films, which in some cases were additionally modified by simultaneous 50 eV acetylene ion bombardment. Surface chemistry of these nanocomposite films was first examined using standard x-ray photoelectron spectroscopy (XPS). XPS was also used to probe photoinduced shifts in peak binding energies upon illumination with a continuous wave green laser and the magnitudes of these peak shifts were interpreted as changes in relative photoconductivity. The four types of films examined all displayed photoconductivity: 4T only, 4T with acetylene ions, 4T with PbS nanoparticles, and 4T with both PbS nanoparticles and acetylene ions. Furthermore, the ion-modified films displayed higher photoconductivity, which was consistent with enhanced bonding within the 4T organic matrix and between 4T and PbS nanoparticles. PbS nanoparticles displayed higher photoconductivity than the 4T component, regardless of ion modification.

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Section: Introductionsupporting

confidence: 44%

Photoresponse of PbS nanoparticles–quaterthiophene films prepared by gaseous deposition as probed by XPS

Majeski

Pleticha

Bolotin

et al. 2012

Journal of Vacuum Science &Amp; Technology A: Vacuum, Surfaces, and Films

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“…All of these powerful techniques provide limited chemical information, if any. On the other hand, electron spectroscopic techniques, such as Auger electron spectroscopy (AES) and x-ray photoelectron spectroscopy (XPS), in addition to their chemical sensitivity, have the ability to reflect the electrical potential of the medium surrounding the probed atom, since the kinetic energy of the detected electron is effected by such potential 20 21 22 23 24 25 26 27 28 29 30 31 32 . AES was used to probe the electrical potential variations across a working device almost three decades ago, but was not pursued due to its limited chemical specificity 33 34 35 .…”

mentioning

confidence: 99%

Location and Visualization of Working p-n and/or n-p Junctions by XPS

Çopuroğlu

Çalışkan

Sezen

et al. 2016

Sci Rep

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X-ray photoelectron spectroscopy (XPS) is used to follow some of the electrical properties of a segmented silicon photodetector, fabricated in a p-n-p configuration, during operation under various biasing configurations. Mapping of the binding energy position of Si2p reveals the shift in the position of the junctions with respect to the polarity of the DC bias applied. Use of squared and triangular shaped wave excitations, while recording XPS data, allows tapping different electrical properties of the device under normal operational conditions, as well as after exposing parts of it to harsh physical and chemical treatments. Unique and chemically specific electrical information can be gained with this noninvasive approach which can be useful especially for localized device characterization and failure analyses.

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“…[4][5][6][7][8][9][10] Furthermore, the use of XPS for probing photovoltaic effects in such systems has recently been reported by Cohen and coworkers, where they perform the so-called chemically resolved electrical measurements under controlled electrical conditions. [11][12][13][14][15] Our measurements are similar in concept but differ drastically in implementation since we also introduce time-dependent measurements, either by recording directly the time-dependent signals with millisecond resolution or harvesting information from the frequency dependence of the response of the system to the external electrical stimuli. We have named the latter technique as dynamical XPS, which is basically implemented by recording XPS data while applying square-wave ͑or in other waveforms͒ electrical pulses with different frequencies to the sample.…”

Section: Introductionmentioning

confidence: 44%

Charging/discharging dynamics of CdS and CdSe films under photoillumination using dynamic x-ray photoelectron spectroscopy

Sezen

Süzer

2010

Journal of Vacuum Science &Amp; Technology A: Vacuum, Surfaces, and Films

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Thin films of CdS and CdSe are deposited on HF-cleaned Si O2 /Si substrates containing ∼5 nm thermally grown silicon oxide. x-ray photoelectron spectroscopy (XPS) data of these films are collected in a dynamic mode, which is based on recording the spectrum under modulation with an electrical signal in the form of ±10 V square-wave pulses. Accordingly, all peaks are twined and shifted with respect to the grounded spectrum. The binding energy difference between the twinned peaks of a dielectric system has a strong dependence on the frequency of the electrical stimuli. Therefore, dynamic XPS provides a means to extract additional properties of dielectric materials, such as effective resistance and capacitance. In this work, the authors report a new advancement to the previous method, where they now probe a photodynamic process. For this reason, photoillumination is introduced as an additional form of stimulus and used to investigate the combined optical and electrical response of the photoconductive thin films of CdS and CdSe using dynamic XPS. © 2010 American Vacuum Society

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(Pb1xCdx)S Nanoparticles Embedded in a Conjugated Organic Matrix, as Studied by Photoluminescence and Light-Induced X-ray Photoelectron Spectroscopy

Cited by 20 publications

References 20 publications

Photoresponse of PbS nanoparticles–quaterthiophene films prepared by gaseous deposition as probed by XPS

Photoresponse of PbS nanoparticles–quaterthiophene films prepared by gaseous deposition as probed by XPS

Location and Visualization of Working p-n and/or n-p Junctions by XPS

Charging/discharging dynamics of CdS and CdSe films under photoillumination using dynamic x-ray photoelectron spectroscopy

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