Deciphering
correlations between physical properties at the nanoscale
requires multimodal measurement with high spatial resolution at the
nanometer scale. One platform to achieve multimodal imaging is through
scanning probe microscopy. In this article, we report the development
of dual-frequency peak force photothermal microscopy, which is a multimodal
atomic force microscopy (AFM)-based spectroscopic imaging method.
The method delivers simultaneous infrared and visible nanoscopy within
one AFM scan frame, mapping the distribution of chemical components
from infrared absorption and photothermal responses from electronic
transitions. We apply this new method to organic–inorganic
perovskite photovoltaics material, revealing chemical distributions
at the surface and detecting localized heat generation. In addition,
we observe that the photothermal heat generation appears at the back
side of the light illumination direction due to local optical field
distributions around nanoscale grains. As a measurement tool, dual-frequency
peak force photothermal microscopy is expected to facilitate the characterizations
of novel photovoltaic materials through correlative mapping of chemicals
and optical absorption properties.