Hybrid
material-based resistive random-access memories (ReRAM)
have gained immense popularity as data storage devices owing to their
high scalability, easy processability, and cost-effectiveness. Herein,
we report the resistive switching (RS) performances of various nanohybrid
materials, consisting of metal-sulfide (ZnS, CuS, and SnS)-grafted
reduced graphene oxide (rGO), by embedding into a thin polymeric layer.
An active layer with a sandwich electrode configuration (ITO/nanohybrid-PMMA
composites/Al) is realized for electrical studies. Additionally, the
RS phenomena are modulated through precisely varying the concentration
of nanohybrid-polymer composite fillers. The electrical studies display
the bipolar-resistive switching properties along with an extremely
low V
SET/V
RESET of ∼−0.44 ± 0.10/+0.50 ± 0.10 V. Also, a
very low write/erase power consumption (P
SET/P
RESET) of ∼1.02 × 10–5 / 1.18 × 10–5 Wcm–2 is obtained for the CuS-grafted rGO nanohybrid. Furthermore, a current
ON/OFF (I
ON/I
OFF) ratio of ∼103–104 is obtained
for all the fabricated devices, which lowers the level of misreading
in the nanohybrid devices. All the devices display excellent RS properties,
especially low operating voltage, high reliability, and high persistency
for optimum loading of nanofillers concentration ranging from 0.3
to 0.5 wt %. The interfacial synergistic effect coupled with trapping
and detrapping of charge carriers is considered responsible for the
observed resistive switching behavior.