Performance of an energy-compensated three-dimensional atom probe

Cerezo, A.; Godfrey, T.J.; Sijbrandij, Sybren; Smith, George Davey; Warren, Peter

doi:10.1063/1.1148477

Cited by 174 publications

(50 citation statements)

References 16 publications

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“…APT is a unique technique able to chemically characterize the interfaces at the nanoscale and to visualize them in three dimensions [14][15][16][17] . Highly dilute impurity concentrations in the tens of ppm can be detected because of the high signal-to-noise ratio in the mass spectra.…”

Section: Discussionmentioning

confidence: 99%

“…In the past two decades, Atom Probe Tomography (APT) has emerged as one of the promising nano-analytical techniques [14][15][16][17] . Until recently APT studies of solar cells have been largely restricted by difficulties in the sample preparation process and the limited capability of analyzing semiconductor materials using conventional pulsed-voltage atom probes.…”

Section: Introductionmentioning

confidence: 99%

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Atom Probe Tomography Studies on the Cu(In,Ga)Se<sub>2</sub> Grain Boundaries

Cojocaru‐Mirédin

Schwarz

Choi

et al. 2013

JoVE

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Compared with the existent techniques, atom probe tomography is a unique technique able to chemically characterize the internal interfaces at the nanoscale and in three dimensions. Indeed, APT possesses high sensitivity (in the order of ppm) and high spatial resolution (sub nm).Considerable efforts were done here to prepare an APT tip which contains the desired grain boundary with a known structure. Indeed, sitespecific sample preparation using combined focused-ion-beam, electron backscatter diffraction, and transmission electron microscopy is presented in this work. This method allows selected grain boundaries with a known structure and location in Cu(In,Ga)Se 2 thin-films to be studied by atom probe tomography.Finally, we discuss the advantages and drawbacks of using the atom probe tomography technique to study the grain boundaries in Cu(In,Ga)Se 2 thin-film solar cells.

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Section: Discussionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Atom Probe Tomography Studies on the Cu(In,Ga)Se<sub>2</sub> Grain Boundaries

Cojocaru‐Mirédin

Schwarz

Choi

et al. 2013

JoVE

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“…APT and field-ion microscopy (FIM) experiments [25,26] were performed using conventional APT [27,28] and an Imago Scientific Instrument's LEAP tomograph [29]. Prior to conventional APT analysis, specimens were imaged at 40-50 K with FIM at background gauge pressures of neon that varied from 6.7 · 10 À4 to 2.6 · 10 À3 Pa (5 · 10 À6 to 2 · 10 À5 torr).…”

Section: Methodsmentioning

confidence: 99%

Temporal evolution of the nanostructure and phase compositions in a model Ni–Al–Cr alloy

et al. 2006

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In a Ni-5.2 Al-14.2 Cr at.% alloy with moderate solute supersaturations and a very small c/c 0 lattice parameter misfit, the nanostructural and compositional pathways during c 0 (L1 2 ) precipitation at 873 K are investigated using atom-probe tomography, conventional transmission electron microscopy, and hardness measurements. Nucleation of high number densities (N v > 10 23 m À3 ) of solute-rich precipitates (mean radius = AERae = 0.75 nm), with a critical nucleus composition of Ni-18.3 ± 0.9 Al-9.3 ± 0.7 Cr at.%, initiates between 0.0833 and 0.167 h. With increasing aging time (a) the solute concentrations decay in spheroidal precipitates (AERae < 10 nm); (b) the observed early-stage coalescence peaks at maximum N v in coincidence with the smallest interprecipitate spacing; and (c) the reaction enters a quasi-stationary regime where growth and coarsening operate concomitantly. During this quasi-stationary regime, the c (face-centered cubic)-matrix solute supersaturations decay with a power-law dependence of about À1/3, while the dependencies of AERae and N v are 0.29 ± 0.05 and À0.64 ± 0.06 at a coarsening rate slower than model predications. Coarsening models allow both equilibrium phase compositions to be determined from the compositional measurements. The observed early-stage coalescence is discussed in further detail.

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“…Therefore, hybrid techniques of CCD readout (precise imaging) and pixel readout (precise timing) have been adopted [17], [18]. Again, the complexity of such special detector set-ups and especially the usually rather low frame rates of the CCD component require the application of alternative concepts.…”

Section: Etection Of Single Particles or Photons With A Microchannementioning

confidence: 99%

Multiple hit readout of a microchannel plate detector with a three-layer delay-line anode

Jagutzki

Cerezo

Czasch

et al. 2002

IEEE Trans. Nucl. Sci.

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361

303

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Abstract-We have developed a delay-line readout technique for microchannel plate detectors with an increased acceptance for multiple hit events compared to standard two-layer delay-line anodes. This technique allows unambiguous determination of arrival time and position of at least two simultaneously detected particles, and/or to detect an even larger number of particles in a shower, as long as any two particles do not arrive both at the same time and at the same position within certain limits. We demonstrate and discuss the abilities and limitations of this technique and the relevance for certain experimental tasks.

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Performance of an energy-compensated three-dimensional atom probe

Cited by 174 publications

References 16 publications

Atom Probe Tomography Studies on the Cu(In,Ga)Se<sub>2</sub> Grain Boundaries

Atom Probe Tomography Studies on the Cu(In,Ga)Se<sub>2</sub> Grain Boundaries

Temporal evolution of the nanostructure and phase compositions in a model Ni–Al–Cr alloy

Multiple hit readout of a microchannel plate detector with a three-layer delay-line anode

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