1999
DOI: 10.1016/s0168-9002(98)00951-6
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Performance of CdZnTe detectors passivated with energetic oxygen atoms

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Cited by 15 publications
(5 citation statements)
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“…Our results, which we present below, support this general idea [14][15][16][17] that the Te layer is formed during the fabrication process, which later becomes partially or completely oxidized after the passivation step, or as a result of natural oxidation in air. The later process starts as soon as the surface of CZT is exposed to air or to the oxygen outgasing in the sputtering chamber.…”
Section: B Surface Leakage Currentsupporting
confidence: 82%
See 1 more Smart Citation
“…Our results, which we present below, support this general idea [14][15][16][17] that the Te layer is formed during the fabrication process, which later becomes partially or completely oxidized after the passivation step, or as a result of natural oxidation in air. The later process starts as soon as the surface of CZT is exposed to air or to the oxygen outgasing in the sputtering chamber.…”
Section: B Surface Leakage Currentsupporting
confidence: 82%
“…As is well know in semiconductor science, nonstoichiometric material is typically formed on the surface of semiconductors after the dicing and polishing steps. In many cases this non-stoichimetric layer can be removed by chemical etching; however, in the case of CZT, it appears that bromine etching leaves a Te-enriched layer on the CZT surface [14][15][16][17]. There are no direct measurements of the electronic properties of the Te layer on the CZT surface, but some interesting results were obtained for CdTe material.…”
Section: B Surface Leakage Currentmentioning
confidence: 99%
“…The surface properties of CdZnTe detectors influence the electric fields inside the wafers, and thus significantly affect the charge transport in radiation detectors. 11,12 A rough surface increases the leakage current and creates additional trapping centers that adversely affect the detector's performance. 13 Therefore, it is important to study surface processes and identify methods that produce the best surfaces for optimum detection performance.…”
Section: Introductionmentioning
confidence: 99%
“…Chen used an aqueous solution of hydrogen peroxide H O in the oxidation of CZT surface [4]. Prettyman treated the CZT surface with energetic neutral oxygen atoms, and reported that the leakage current of the detector was decreased after the treatment [5]. NH F H O is the effective agent for the CZT surface passivation.…”
Section: Introductionmentioning
confidence: 99%