Performance of scintillating waveguides for CCD-based X-ray detectors

Badel, Xavier; Norlin, Börje; Kleimann, P.; Williams, L.; Moody, S.J.; Tyrrell, Glenn C.; Fröjdh, Christer; Linnros, Jan

doi:10.1109/tns.2005.862981

Cited by 28 publications

(7 citation statements)

References 23 publications

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“…The incident X-ray photons can be converted into visible luminescence by scintillators (e.g., CsI: Tl, and GOS: Tb). Next, the luminescence is directed to the charge-coupled device array using an optical lens system ( Figure 4(a) ) [ 51 , 52 ]. However, the optical lens system can reduce the number of photons reaching the charge-coupled device arrays, which may result in low quantum efficiency and high image noise, and thus lead to poor image quality.…”

Section: Flat-panel Detector-based Radiographymentioning

confidence: 99%

Recent Development in X-Ray Imaging Technology: Future and Challenges

Chen

et al. 2021

Research

133

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X-ray imaging is a low-cost, powerful technology that has been extensively used in medical diagnosis and industrial nondestructive inspection. The ability of X-rays to penetrate through the body presents great advances for noninvasive imaging of its internal structure. In particular, the technological importance of X-ray imaging has led to the rapid development of high-performance X-ray detectors and the associated imaging applications. Here, we present an overview of the recent development of X-ray imaging-related technologies since the discovery of X-rays in the 1890s and discuss the fundamental mechanism of diverse X-ray imaging instruments, as well as their advantages and disadvantages on X-ray imaging performance. We also highlight various applications of advanced X-ray imaging in a diversity of fields. We further discuss future research directions and challenges in developing advanced next-generation materials that are crucial to the fabrication of flexible, low-dose, high-resolution X-ray imaging detectors.

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Section: Flat-panel Detector-based Radiographymentioning

confidence: 99%

Recent Development in X-Ray Imaging Technology: Future and Challenges

Chen

et al. 2021

Research

133

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“…Total internal reflection at pixel side walls is desirable in pixelated CsI(Tl) scintillation films. All photons generated in pixels with incidence angles smaller than the critical angle 331 will be totally reflected without light loss because the refractive index of CsI (n ¼ 1.74) is larger than that of SiO 2 (n ¼ 1.46) [6,9]. A 1-mm-thick SiO 2 layer was deposited on the pixelated CsI(Tl) scintillation films by the PECVD process at 150 1C and a 1-mm-thick reflective aluminum layer deposited by sputtering.…”

Section: Reflector Coatings On Pixelated Csi:tl Scintillator Filmsmentioning

confidence: 99%

Improvement of the sensitivity and spatial resolution of pixelated CsI:Tl scintillator with reflective coating

Kyung

Bae

Lee

et al. 2009

Nuclear Instruments and Methods in Physics Research Section A:

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“…The advent of space-oriented applications has greatly enriched the theory of material science and suggested new directions in the preparation of foundation materials. To date, the United States, Russia, Japan and the European Union have developed more than 100 types of equipment for material -science experiments in space [1][2][3][4]. Numerous microgravity material-science experiments have been conducted using space stations, space shuttles, microgravity rockets, weightless aircraft, and drop towers [5,6].…”

Section: Introductionmentioning

confidence: 99%

Image contrast enhancement algorithm for X-ray observation of space materials in situ

Liu

Pan

et al. 2022

J. Inst.

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Chinese Space Station has planned a high-temperature material science experiment rack, equipped with an X-ray projection imaging module, to support the development of material experiments and research in space. BiFeO3 has been selected as the first batch of experimental materials for Chinese Space Station. The melting and solidification process of BiFeO3, an opaque, high-temperature material, is observed by X-ray observation module in situ. X-ray is the dominant way to observe opaque materials due to its penetrability. In-situ observation of materials is the top priority of this study, so we have strict requirements on image quality, and high-quality images can better analyze the properties and properties of materials. Limited by narrow size and high temperature conditions, the X-ray images collected have low contrast, serious noise pollution, and poor imaging quality. To enhance the contrast and improve the edge details of such images, a grayscale weighted histogram equalization combined with high-frequency enhancement (GWHE-HFE) algorithm is proposed. First, we add a mask to the input image to obtain the region of interest (ROI), and then filter out the low-frequency components of the image by Gaussian high-pass filter to preserve high-frequency details. Second, the image obtained in the previous and the X-ray image of ROI are respectively multiplied by a coefficient and added to obtain the edge-emphasized X-ray image. And then, we use grayscale weighted histogram equalization (GWHE) to process the image obtained in the second step to obtain the contrast enhanced X-ray image. The enhanced image shows the crystal grains and the thin bands where the solid and the melt intersect, and it is helpful to accurately locate the solid solution interface. Experiments on X-ray images of BiFeO3 growth demonstrate that this combined method outperforms existing ones both qualitatively and quantitatively, providing an in-depth and effective analysis method for in high-temperature material-science experiments.

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Performance of scintillating waveguides for CCD-based X-ray detectors

Cited by 28 publications

References 23 publications

Recent Development in X-Ray Imaging Technology: Future and Challenges

Recent Development in X-Ray Imaging Technology: Future and Challenges

Improvement of the sensitivity and spatial resolution of pixelated CsI:Tl scintillator with reflective coating

Image contrast enhancement algorithm for X-ray observation of space materials in situ

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