PETRA IV: the ultralow-emittance source project at DESY

Schroer, Christian G.; Agapov, Ilya; Brefeld, W.; Brinkmann, R.; Chae, Yong Chul; Chao, H. C.; Eriksson, Mikael; Keil, Joachim; Gavaldà, Xavier; Röhlsberger, Ralf; Seeck, O. H.; Sprung, Michael; Tischer, M.; Wanzenberg, Rainer; Weckert, E.

doi:10.1107/s1600577518008858

Cited by 123 publications

(99 citation statements)

References 35 publications

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“…To gain detailed knowledge of the coherence properties of X-ray radiation, its manipulation, and especially its preservation plays an increasingly important role at synchrotron beamlines, not least because of present and future upgrades of synchrotron facilities to diffraction-limited storage rings, e.g., PETRA IV [1], ALS-U [2,3], ESRF-EBS [4] or MAX IV [5]. The most obvious beneficiaries of a high coherent flux are coherent imaging and scattering experiments such as Fourier-transform holography (FTH) [6][7][8][9], X-ray ptychography [10][11][12][13], coherent diffractive imaging (CDI) [14][15][16], scanning transmission X-ray microscopy (STXM) [17][18][19], as well as X-ray photon correlation spectroscopy (XPCS) [20][21][22].…”

Section: Introductionmentioning

confidence: 99%

Direct 2D spatial-coherence determination using the Fourier-analysis method: multi-parameter characterization of the P04 beamline at PETRA III

Bagschik¹,

Wagner²,

Buss³

et al. 2020

Opt. Express

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We present a systematic 2D spatial-coherence analysis of the soft-X-ray beamline P04 at PETRA III for various beamline configurations. The influence of two different beam-defining apertures on the spatial coherence properties of the beam is discussed and optimal conditions for coherence-based experiments are found. A significant degradation of the spatial coherence in the vertical direction has been measured and sources of this degradation are identified and discussed. The Fourier-analysis method, which gives fast and simple access to the 2D spatial coherence function of the X-ray beam, is used for the experiment. Here, we exploit the charge scattering of a disordered nanodot sample allowing the use of arbitrary X-ray photon energies with this method.

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Section: Introductionmentioning

confidence: 99%

Direct 2D spatial-coherence determination using the Fourier-analysis method: multi-parameter characterization of the P04 beamline at PETRA III

Bagschik¹,

Wagner²,

Buss³

et al. 2020

Opt. Express

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“…This combined in situ and operando experiment shows exemplarily the flux limitation at state-of-the-art synchrotron beamlines today. However, several 4th generation synchrotrons that are based on a multi-bend achromat lattice will be seeing light within the next few years [58][59][60][61]. Compared to 3rd generation synchrotrons, the brilliance will be boosted by ∼2 orders of magnitude, which directly translates into increased focused photon flux at nanoprobe endstations.…”

Section: Discussionmentioning

confidence: 99%

Defect activation and annihilation in CIGS solar cells: an operando x-ray microscopy study

et al. 2020

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The efficiency of thin-film solar cells with a Cu( -In x 1 Ga x )Se 2 absorber is limited by nanoscopic inhomogeneities and defects. Traditional characterization methods are challenged by the multi-scale evaluation of the performance at defects that are buried in the device structures. Multi-modal x-ray microscopy offers a unique tool-set to probe the performance in fully assembled solar cells, and to correlate the performance with composition down to the micro-and nanoscale. We applied this approach to the mapping of temperature-dependent recombination for Cu( -In x 1 Ga x )Se 2 solar cells with different absorber grain sizes, evaluating the same areas from room temperature to  100 C. It was found that poor performing areas in the large-grain sample are correlated with a Cu-deficient phase, whereas defects in the small-grain sample are not correlated with the distribution of Cu. In both samples, classes of recombination sites were identified, where defects were activated or annihilated by temperature. More generally, the methodology of combined operando and in situ x-ray microscopy was established at the physical limit of spatial resolution given by the device itself. As proof-ofprinciple, the measurement of nanoscopic current generation in a solar cell is demonstrated with applied bias voltage and bias light.

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“…Further experimental analysis is needed to determine the origin of the current background level to make the necessary improvements in view of future ptychographic scanning microscopes at fourth generation synchrotron radiation sources. 5,42,43…”

Section: Discussionmentioning

confidence: 99%

“…The hard X-ray scanning microscope PtyNAMi at beamline P06 of the synchrotron radiation source PE-TRA III at DESY in Hamburg, Germany, is designed in view of the above-mentioned requirements. It serves as a test bed for high-resolution and high-sensitivity imaging for the future upgrade of PETRA III to the ultralow emittance synchrotron radiation source PETRA IV 5 and is continuously upgraded. The basic design was described in Ref.…”

Section: Introductionmentioning

confidence: 99%

Ptychographic Nano-Analytical Microscope (PtyNAMi) at PETRA III: signal-to-background optimization for imaging with high sensitivity

Schroer

Seyrich

Schropp

et al. 2019

X-Ray Nanoimaging: Instruments and Methods IV

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The X-ray scanning microscope PtyNAMi at beamline P06 of PETRA III at DESY in Hamburg, Germany, is designed for high-spatial-resolution 3D imaging with high sensitivity. Besides optimizing the coherent flux density on the sample and the precision mechanics of the scanner, special care has been taken to reduce background signals on the detector. The optical path behind the sample is evacuated up until the sensor of a four-megapixel detector that is placed into the vacuum. In this way, parasitic scattering from air and windows close to the detector is avoided. The instrument has been commissioned and is in user operation. The main commissioning results of the low-background detector system are presented. A signal-to-noise model for small object details is derived that includes incoherent background scattering.

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PETRA IV: the ultralow-emittance source project at DESY

Abstract: The PETRA IV project aims at upgrading PETRA III into an ultralow-emittance synchrotron radiation source.

Cited by 123 publications

References 35 publications

Direct 2D spatial-coherence determination using the Fourier-analysis method: multi-parameter characterization of the P04 beamline at PETRA III

Direct 2D spatial-coherence determination using the Fourier-analysis method: multi-parameter characterization of the P04 beamline at PETRA III

Defect activation and annihilation in CIGS solar cells: an operando x-ray microscopy study

Ptychographic Nano-Analytical Microscope (PtyNAMi) at PETRA III: signal-to-background optimization for imaging with high sensitivity

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