Phase decomposition in nanocrystalline Cr0.8Cu0.2 thin films

Chakraborty, Jay; Harzer, Tristan Philipp; Duarte, María Jazmin; Dehm, Gerhard

doi:10.1016/j.jallcom.2021.161391

Cited by 3 publications

(1 citation statement)

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“…Lee et al have demonstrated the possibility of in situ probing of the film with XRD in oxide MBE growth [124] . Hong et al fabricated ultrathin LaTiO 3 /SrTiO 3 heterostructures via oxide MBE monitored with in situ XRD in real time, allowing the accurate determination of the thicknesses required to accomplish well-defined interfaces and the designed heterostructures [125] . Additionally, XRD also plays a crucial role in monitoring the dynamic evolution of material growth.…”

Section: X-ray Diffraction (Xrd)mentioning

confidence: 99%

Development of in situ characterization techniques in molecular beam epitaxy

Shen,

Zhan,

et al. 2024

J. Semicond.

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Ex situ characterization techniques in molecular beam epitaxy (MBE) have inherent limitations, such as being prone to sample contamination and unstable surfaces during sample transfer from the MBE chamber. In recent years, the need for improved accuracy and reliability in measurement has driven the increasing adoption of in situ characterization techniques. These techniques, such as reflection high-energy electron diffraction, scanning tunneling microscopy, and X-ray photoelectron spectroscopy, allow direct observation of film growth processes in real time without exposing the sample to air, hence offering insights into the growth mechanisms of epitaxial films with controlled properties. By combining multiple in situ characterization techniques with MBE, researchers can better understand film growth processes, realizing novel materials with customized properties and extensive applications. This review aims to overview the benefits and achievements of in situ characterization techniques in MBE and their applications for material science research. In addition, through further analysis of these techniques regarding their challenges and potential solutions, particularly highlighting the assistance of machine learning to correlate in situ characterization with other material information, we hope to provide a guideline for future efforts in the development of novel monitoring and control schemes for MBE growth processes with improved material properties.

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Section: X-ray Diffraction (Xrd)mentioning

confidence: 99%

Development of in situ characterization techniques in molecular beam epitaxy

Shen,

Zhan,

et al. 2024

J. Semicond.

View full text Add to dashboard Cite

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Versatile Layered Hydroxide Precursors for Generic Synthesis of Cu‐Based Materials

et al. 2022

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The ability to mix multiple elements in a structure is crucial for obtaining Cu‐based nanostructures and microstructures with desirable physicochemical properties. Precursors containing multiple metal cations, such as layered double hydroxides, have been used for the synthesis of multielement materials. However, these precursors experience difficulty containing large cations, which limits the functionalities of the derived materials. Herein, the development of Cu‐based hydroxy double salts (HDSs), versatile precursors that accommodate a broad range of metal cations with homogeneous distributions, is reported. Up to 25 different metal cations are mixed with Cu in an HDS single phase, individually and simultaneously. The HDSs further exhibit useful properties with respect to anion exchange, exfoliation, and phase transformation to metal oxides. During the metal oxide transformation process, the formed crystal structures are mainly dependent on the ionic radius of the secondary metal cations. To prove their utility as precursors, the metal oxides derived from the HDSs are tested and found that they exhibited high catalytic activities for CO oxidation. This study significantly expands the compositional and structural freedom of Cu‐based multi‐elemental materials.

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