Phase noise amplitude distribution as indicator of origin of random phase perturbation in a test oscillator

Abstract

In this paper we present an analysis of phase noise distribution. Phase noise, of designed and realized test oscillator, as a consequence of low frequency (LF) noise up-conversion was simulated. The analysis shows that low frequency noise sources, which are inside of transistor, give the pure Gaussian distribution of phase noise and LF noise sources located out of transistor change this distribution. This behavior could be explained by the influence of transistors and transistor's package impedance, which contribute to the signal delay.

Phase Noise Analysis of Time Transfer over White Rabbit-Network Based Optical Fibre Links

“…J.H. Vukovic et al also reported on phase noise distribution, stating that intrinsic perturbations originating from transistors in electronic oscillators produce a pure Gaussian distribution, while perturbations from active elements change the Gaussian distribution to an exponential one [ 16 ]. However, it was noted that their pure Gaussian distribution for the intrinsic perturbation case could be fitted with a mixture of Gaussian probability density functions.…”