2014
DOI: 10.1063/1.4890032
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Phase ordering and its effect on magnetic and structural properties of FeRh ultrathin films

Abstract: Applications using FeRh for controllable exchange coupling of two magnetic layers with in-plane and out-of-plane anisotropies require ultrathin (∼10 nm) films with pure antiferromagnetic (AF) FeRh α″ phase at room temperature (RT). However, it is also well known that the antiferromagnetic-ferromagnetic (AF-FM) transition of FeRh is sensitive to composition and deteriorates at low thicknesses. Hence, in this work, we study the composition-dependent phase ordering of co-sputtered FeRh thin films at ultrathin thi… Show more

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Cited by 12 publications
(15 citation statements)
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“…In this Rapid Communication, we show that, in sharp contrast to previous attempts in which nanothin FeRh alloy films were shown to grow in the Volmer-Weber growth mode [15][16][17][18][19], smooth chemically well-ordered single-crystal fully functional nanothin FeRh alloy films can be synthesized if proper dc-magnetron sputtering deposition parameters are chosen. In particular, we demonstrate that sputter-grown sub-15 nm thick FeRh alloy films deposited at an Ar pressure of about 0.1 Pa onto (001)-oriented MgO substrates grow in an induced Frank-van der Merwe growth mode for t FeRh >5 nm, as consequence of the atompeening [20] effect, i.e.…”
Section: Introductioncontrasting
confidence: 57%
“…In this Rapid Communication, we show that, in sharp contrast to previous attempts in which nanothin FeRh alloy films were shown to grow in the Volmer-Weber growth mode [15][16][17][18][19], smooth chemically well-ordered single-crystal fully functional nanothin FeRh alloy films can be synthesized if proper dc-magnetron sputtering deposition parameters are chosen. In particular, we demonstrate that sputter-grown sub-15 nm thick FeRh alloy films deposited at an Ar pressure of about 0.1 Pa onto (001)-oriented MgO substrates grow in an induced Frank-van der Merwe growth mode for t FeRh >5 nm, as consequence of the atompeening [20] effect, i.e.…”
Section: Introductioncontrasting
confidence: 57%
“…2c) shows a strong decrease of the total phase shift. From its mean slope extracted on the whole FeRh layer, we obtained a residual magnetization parallel to the film equal to 0.28±0.13 T. This value appears to be higher than previously reported1440.…”
Section: Resultsmentioning
confidence: 48%
“…Research on FeRh was originally conducted on bulk samples [1,[10][11][12] but more recently, due to the envisioned applications [3,5,8], it focuses on thin films. The desired AF phase is present only for a rather narrow interval of the Fe-to-Rh composition ratios [12], which are achieved experimentally by a variation of the deposition conditions [13][14][15] and by a post-preparation heat treatment [16]. Consequently, the growth of high quality FeRh thin films is a rather complex task which requires a lot of optimisation of the preparation procedure and a deposition of large series of samples [13][14][15][16].…”
Section: Introductionmentioning
confidence: 99%
“…The desired AF phase is present only for a rather narrow interval of the Fe-to-Rh composition ratios [12], which are achieved experimentally by a variation of the deposition conditions [13][14][15] and by a post-preparation heat treatment [16]. Consequently, the growth of high quality FeRh thin films is a rather complex task which requires a lot of optimisation of the preparation procedure and a deposition of large series of samples [13][14][15][16]. The magnetic phase transition in the prepared films is usually studied by magnetometry, for example by superconducting quantum interference device (SQUID), where not only the phase transition temperature but also the remaining uncompensated magnetic moment in the low-temperature AF phase is measured [14,15].…”
Section: Introductionmentioning
confidence: 99%
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