Phase-retrieval and intensity-only reconstruction algorithms for optical diffraction tomography

3D intensity and phase imaging from light field measurements in an LED array microscope

“…2D phase retrieval methods are easily combined with tomography [4][5][6][7][8][9][10][11][12], but when wave-optical effects become more prominent (as in microscopy), diffraction tomography [13][14][15][16][17][18][19] becomes necessary. All these methods require both angle scanning and multiple measurements at each angle, or a reference beam.…”

Optical tomography for dielectric profiling in processing electronic materials

“…The uniqueness of solution, in this case, can be ensured relying on the analytical properties of the total field. In fact, the addition of the reflected field E 0 to the scattered one E s , satisfying the condition |E s |<|E 0 |, removes the ambiguities in the solution [12].…”

A Novel Phase Retrieval Approach for Electromagnetic Inverse Scattering Problem With Intensity-Only Data

“…Also the phase is very sensitive to the probe shaking and tends to be easily corrupted by noise in high frequency (especially beyond 10 GHz). Recently, one of the research interests in EM inverse scattering problem is on how to solve the problem without the phase information of the measured field [1][2][3][4][5][6][7][8][9][10][11][12].…”

“…Many results on the EM inverse scattering problems with onlyintensity information have been reported in [1][2][3][4][5][6][7][8]. Except for the methods based on linear approximations or a priori information of the support of the objects [6][7][8], there are two popular ways to deal with intensity-only data in the field of EM inverse scattering.…”